CAAC-OS Substrate for GaN LED Crystal Quality

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Solution Overview

Problem

The crystal quality of light-emitting layers in gallium nitride-based light-emitting devices is often compromised by the use of inexpensive substrates, leading to inefficiencies and reduced durability, necessitating the development of substrates with improved crystal quality for enhanced productivity in manufacturing.

Innovation Solution

A c-axis-aligned crystal region (CAAC-OS) metal oxide semiconductor substrate is used as a supporting substrate for light-emitting devices, with heat treatment at high temperatures to form a CAAC-OS substrate, which includes layers like gallium, indium, and zinc, and is stacked over base substrates like sapphire or yttria-stabilized zirconia, with a buffer layer to reduce lattice mismatch and improve crystal quality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If inexpensive substrates like sapphire are used, then manufacturing cost is reduced, but crystal quality of light-emitting layer deteriorates

Engineering Contradiction:
Improvemanufacturing costVSAvoidcrystal quality
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

A buffer layer is introduced as an intermediary between the sapphire substrate and the light-emitting layer. This buffer layer has a lattice constant intermediate between sapphire and the light-emitting layer, reducing lattice mismatch and improving crystal quality without requiring expensive substrates.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent uses a composite structure consisting of sapphire substrate, buffer layer, and light-emitting layer. Each layer is optimized for its specific function, creating a composite material system that achieves both cost-effectiveness and high crystal quality.

Inventive Principle:
Principle #40Composite materials

2Manufacturing precision

If gallium nitride single crystal substrate is used, then crystal quality of light-emitting layer is improved, but manufacturing complexity increases

Engineering Contradiction:
Improvecrystal qualityVSAvoidsubstrate complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The buffer layer serves as a mediator that simplifies the substrate requirement. Instead of needing complex gallium nitride single crystal substrates, the patent uses a simple sapphire substrate with an added buffer layer, reducing manufacturing complexity while maintaining high crystal quality.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Ease of manufacture

If lattice mismatch is not addressed, then manufacturing process is simplified, but emission efficiency deteriorates

Engineering Contradiction:
Improvemanufacturing process simplicityVSAvoidemission efficiency
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The buffer layer acts as a mediator that addresses lattice mismatch without complicating the manufacturing process. It provides a gradual transition in lattice constant, reducing dislocation density and improving emission efficiency while maintaining process simplicity.

Inventive Principle:
Principle #24Intermediary (Mediator)

4Manufacturing precision

If buffer layer is added to reduce lattice mismatch, then crystal quality is improved, but device structure becomes more complex

Engineering Contradiction:
Improvecrystal qualityVSAvoidlayer structure
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent segments the device structure into distinct functional layers: sapphire substrate, buffer layer, and light-emitting layer. This segmentation allows each layer to be optimized independently, improving crystal quality while keeping the overall structure manageable and systematic.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for the formation of light-emitting devices with favorable crystal quality and high productivity, enabling efficient manufacturing of gallium nitride-based LEDs with improved emission efficiency and durability.

Implementation Method 1

The CAAC-OS substrate is subjected to heat treatment at a high temperature of approximately 700° C. to 1500° C. in manufacture.

Methodology Applied
Scientific EffectHeat treatment: Heat Treatment

Implementation Method 2

a single crystal film is grown in order to form a crystal surface which is epitaxially grown

Methodology Applied
Scientific EffectCrystallization: Crystallisation

Implementation Method 3

The buffer layer is a film having a function of reducing lattice mismatch in the case where the lattice constant of the CAAC-OS substrate is different from that of the light-emitting diode layer

Methodology Applied
Scientific EffectLattice mismatch reduction:

Implementation Method 4

a single crystal film is grown in order to form a crystal surface which is epitaxially grown

Methodology Applied
Scientific EffectEpitaxy: Epitaxy

Data Source

PatentUS8872174B2Light-emitting device
Publication Date: 2014.10.28 SEMICON ENERGY LAB CO LTD
  • US8872174B2 patent drawing
  • US8872174B2 patent drawing
  • US8872174B2 patent drawing

AI summary

To provide a novel light-emitting device that can be manufactured with high productivity. In a light-emitting device in which a light-emitting diode (LED) layer is provided over a substrate, a metal oxide semiconductor (c-axis aligned crystalline oxide semiconductor (CAAC-OS)) substrate including a crystal part having a c-axis which is substantially perpendicular to a surface of the substrate is used as the substrate. The substrate may have either a single-layer structure of a CAAC-OS substrate or a structure in which a thin CAAC-OS substrate is stacked over a base substrate.