Cap Slit Inspection Using Convergent Sidewall Illumination
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Solution Overview
Problem
Existing cap inspection technologies are not precise and robust, leading to reduced production speed and ineffective inspection of slits or recesses on caps, which are crucial for proper functioning and tamper-evident mechanisms.
Innovation Solution
An apparatus and method utilizing an illuminator to illuminate the cap's lateral surface, combined with a conveyor and multiple cameras to capture high-contrast images of the slits, ensuring accurate inspection through a collimated light system and image processing to derive slit information.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a light source illuminates the lateral surface and a camera captures image data while the cap rotates, then the entire surface can be inspected, but production speed is reduced due to transportation and rotation time
Solution Approach 1:
The cap is pre-positioned on the conveyor belt at the correct orientation before reaching the inspection zone, eliminating the need for rotation during inspection. The conveyor belt is synchronized with the inspection system to ensure the slit-facing surface is always presented to the camera, allowing continuous high-speed inspection without deceleration or rotation movements.
Solution Approach 2:
The mechanical rotation system is replaced with a conveyor-based transport system that moves the cap linearly through the inspection zone. Instead of rotating the cap to present different surfaces, the conveyor belt transports caps in sequence, and the illumination/camera system is configured to inspect the relevant surfaces at the correct positions, substituting mechanical rotation with linear transport and strategic positioning.
2Illumination intensity
If lamps are arranged around the cap to illuminate it, then the cap can be inspected, but the inspection precision and robustness are insufficient
Solution Approach 1:
Instead of uniform illumination from all directions, the patent employs targeted lighting specifically directed at the slit or recess features on the cap. The illumination system is positioned and angled to create optimal contrast for detecting defects in the connecting zone, concentrating light where it is most needed for inspection rather than providing general ambient lighting.
Solution Approach 2:
The illumination system utilizes specific light angles and intensities to create contrast variations that highlight the slit features. By controlling the direction and quality of light, the system enhances the visual distinction between the slit regions and the surrounding cap material, improving detectability of defects through optical contrast rather than color changes.
3Difficulty of detecting and measuring
If a laser beam illuminates the inside of the cap, then internal features can be inspected, but the solution is not robust and precise enough
Solution Approach 1:
The patent introduces a carefully designed illumination system as an intermediary between the light source and the cap interior. This intermediary system includes reflectors, diffusers, or structured lighting elements that control and condition the light before it reaches the inspection area, ensuring consistent and reliable illumination that enhances feature visibility while maintaining system robustness.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution provides precise and efficient inspection of cap slits, enhancing production line efficiency by maintaining high production speed while ensuring high-quality inspection results.
Implementation Method 1
an illuminator, configured to illuminate the cap
Data Source
AI summary
An apparatus for inspecting a slit made on a lateral surface of a plastic cap includes: a conveyor for transporting the cap along a path; an illuminator, configured to illuminate the lateral surface of the cap placed at an inspection position, wherein the cap, at the inspection position, is aligned with an inspection axis, the inspection axis being oriented vertically and transversely to the path; a plurality of cameras surrounding the inspection axis and configured to capture image data representing a plurality of images of the lateral surface of the cap at the inspection position; a control unit, configured to receive the image data and process them to derive therefrom information relating to the slit, the apparatus being characterized in that the illuminator includes a side wall extending around the inspection axis to illuminate all of the lateral surface of the cap with rays that converge towards the inspection axis, the side wall delimiting an internal space and including an inlet opening and an outlet opening to allow for passage of the cap into and out of the internal space, respectively.