Capacitance MEMS Sensor Recessed Diaphragm Design

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Solution Overview

Problem

Existing capacitance type MEMS sensors face challenges in increasing sensitivity while maintaining a small size and reducing manufacturing costs, as larger electrode areas require larger device sizes and costly gas-phase etching processes for sacrificing layer removal.

Innovation Solution

A capacitance type MEMS sensor design featuring a semiconductor substrate with a recessed diaphragm and insulating film, where the diaphragm is positioned within the recess to face the sidewall as a movable electrode, allowing for increased facing area without the need for a sacrificing layer, enabling enhanced sensitivity and reduced manufacturing costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the area of movable electrode and fixed electrode is increased to enhance sensitivity, then the sensitivity is improved, but the device size grows larger

Engineering Contradiction:
ImprovesensitivityVSAvoiddevice size
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The patent transitions from a planar electrode arrangement to a three-dimensional configuration by forming the movable electrode as a vertical pillar structure within a recess. This dimensional change allows the electrode facing area to be increased in the vertical direction while maintaining a compact planar footprint, thereby improving sensitivity without significantly increasing device size.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The movable electrode pillar is nested within the recess formed in the semiconductor substrate. This nesting arrangement allows the electrode to extend vertically into the substrate, increasing the facing area between the movable and fixed electrodes while keeping the overall device footprint small.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Reliability

If a polysilicon layer is formed as a sacrificing layer to support the diaphragm in a movable state, then the diaphragm can be supported, but the manufacturing cost increases due to costly gas-phase etching processes

Engineering Contradiction:
Improvediaphragm supportVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent removes the polysilicon sacrificing layer and the associated costly gas-phase etching process entirely. Instead, the diaphragm is directly formed as a silicon pillar using standard semiconductor fabrication processes, and the recess structure provides mechanical support without requiring a separate sacrificing layer.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The silicon substrate itself serves as both the structural support and the material for the movable electrode. The recess formed in the substrate provides the necessary mechanical support for the diaphragm pillar, eliminating the need for external sacrificing layers and complex release processes.

Inventive Principle:
Principle #25Self-service

3Device complexity

If the diaphragm is made from the same material as the semiconductor substrate, then manufacturing complexity is reduced, but the diaphragm may adhere to the substrate during processing

Engineering Contradiction:
Improvemanufacturing complexityVSAvoidadhesion
Core Design Contradiction:
Device complexityVSObject-generated harmful factors

Solution Approach 1:

The patent applies different surface treatments or structural configurations to specific regions. The recess walls may have different surface properties or geometries compared to the bulk substrate, creating local conditions that prevent adhesion while maintaining material uniformity throughout the structure.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The recess structure creates a geometric configuration where the diaphragm pillar is suspended within the recess space, maintaining equal spacing from the substrate surface. This equipotential geometric arrangement prevents adhesion by ensuring no point of the diaphragm is in direct contact with the substrate during processing.

Inventive Principle:
Principle #12Equipotentiality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The design achieves high sensitivity and reduced manufacturing costs by allowing the diaphragm to vibrate freely and expand/contract in response to sound waves, temperature, or humidity, while maintaining a small sensor size and eliminating the need for costly etching processes.

Implementation Method 1

If a sound wave is inputted, the diaphragm vibrates to thereby change the capacitance between the metal layer on the front surface of the diaphragm and the back plate

Methodology Applied
Scientific EffectCapacitance: Capacitance

Implementation Method 2

If a sound wave is inputted, the diaphragm vibrates

Methodology Applied
Scientific EffectSound wave vibration: Sound

Implementation Method 3

if the diaphragm is expanded and contracted by the change in temperature or humidity, it is possible to convert the change in temperature or humidity to an electric signal

Methodology Applied
Scientific EffectThermal expansion: Thermal Expansion

Implementation Method 4

if the diaphragm is expanded and contracted by the change in temperature or humidity

Methodology Applied
Scientific EffectHumidity absorption: Absorption (physical)

Data Source

PatentUS9520505B2Capacitance type MEMS sensor
Publication Date: 2016.12.13 ROHM CO LTD
  • US9520505B2 patent drawing
  • US9520505B2 patent drawing
  • US9520505B2 patent drawing

AI summary

A capacitance type MEMS sensor has a first electrode portion and a second electrode portion facing each other. The sensor includes a semiconductor substrate having a recess dug in a thickness direction of the semiconductor substrate, the recess having sidewalls, one of which serves as the first electrode portion. The sensor further includes a diaphragm serving as the second electrode portion, the diaphragm arranged within the recess to face the first electrode portion in a posture extending along a depth direction of the recess, the diaphragm having a lower edge spaced apart from the bottom surface of the recess, and is made of the same material as the semiconductor substrate. The sensor further includes an insulating film arranged to join the diaphragm to the semiconductor substrate.