Capacitive Sensor Examination Using Initial-Position Capacitance Measurement
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Solution Overview
Problem
Existing methods for testing capacitive sensors require laborious test measurements in artificially created test atmospheres and simulated test conditions, necessitating expensive equipment and time-consuming processes.
Innovation Solution
A computer device and method that determine sensor-specific evaluation variables by measuring capacitance between electrodes and a sensor mass in its initial position without applying external forces or voltages, using inexpensive electronics to define properties like distance, deviation, and spring characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional test measurements are carried out in artificially created test atmospheres and simulated test conditions, then measurement precision and reliability are improved, but device complexity and cost increase
Solution Approach 1:
The patent extracts the essential examination function from complex test atmospheres and simulated conditions, performing sensor characterization directly during manufacturing using the sensor's own structural elements (electrodes and sensor mass) without requiring external test equipment or artificial environments
Solution Approach 2:
The sensor structure itself serves as the measurement system - the electrodes and sensor mass form capacitive elements that are measured during manufacturing, eliminating the need for separate test equipment and artificial test conditions
2Measurement precision
If traditional test measurements are carried out in artificially created test atmospheres and simulated test conditions, then measurement precision is improved, but time consumption increases
Solution Approach 1:
The patent performs sensor characterization measurements during the manufacturing process itself, before the sensor leaves the production line. This preliminary examination during manufacturing eliminates the need for separate post-manufacturing testing, significantly reducing time loss
Solution Approach 2:
The measurement process is integrated into the manufacturing flow, allowing continuous production without interruption for separate testing phases. The sensor is examined during its manufacturing using its own structural elements, eliminating idle time between manufacturing and testing
3Measurement precision
If specialized test equipment is used for traditional sensor testing, then measurement precision is improved, but manufacturing cost increases
Solution Approach 1:
The patent removes the requirement for expensive specialized test equipment by extracting the measurement function from external devices and embedding it within the sensor's own structure, which is already present during manufacturing
Solution Approach 2:
The patent uses the sensor's own structural elements (electrodes and sensor mass) as the measurement components, which are already part of the manufactured product. This eliminates the need to purchase and maintain expensive specialized test equipment, significantly reducing manufacturing costs
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables cost-effective and rapid assessment of capacitive sensor properties without specialized equipment, improving accuracy and detecting manufacturing errors early, thus optimizing production efficiency.
Implementation Method 1
at least one measured variable relating to a first capacitance between a first electrode of the capacitive sensor and the sensor mass
Data Source
AI summary
A computer device for a capacitive sensor. The computer device includes an electronic device, wherein the electronic device is designed and/or programmed in such a way that, by means of the electronic device and taking into account at least one first measured variable which is determined or provided when a sensor mass is in its initial position or initial oscillation and relates to a first capacitance between a first electrode and the sensor mass, at least one evaluation variable relating to a spacing of the sensor mass to the first electrode and/or the second electrode and/or relating to a property of the sensor mass and/or the at least one spring component can be defined as at least part of the evaluation information.