Centering Contact Pad for Probe Tip Alignment
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Solution Overview
Problem
The miniaturization of data storage components increases manufacturing complexity and reduces operational yield due to tighter tolerances, leading to issues with contact reliability and accuracy in testing and manufacturing processes, particularly with the use of wirebond connections and the risk of contamination from bonding wire residues.
Innovation Solution
A testing device with a work piece featuring a contact pad that concurrently contacts both the bottom and sidewall surfaces of a probe tip, utilizing a centering feature to provide simultaneous physical and electrical contact without the need for adhesives or fasteners, allowing for secure and reliable contact even during movement and vibrations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If wirebond connections are used for contact pads, then electrical contact can be established, but contamination from bonding wire residues occurs and manufacturing complexity increases
Solution Approach 1:
The patent removes the wirebond connection step entirely from the manufacturing process. Contact pads are designed with protruding features that directly engage with corresponding recesses in the probe tip, eliminating the need for bonding wires and the associated contamination risks while maintaining reliable electrical contact.
Solution Approach 2:
The patent replaces the mechanical wirebonding process with a direct mechanical engagement system. The protruding contact pad features physically insert into matching recesses in the probe tip, creating both mechanical and electrical connection without requiring thermal or adhesive bonding processes.
2Reliability
If contact force is increased to maintain contact during movement, then contact reliability improves, but stress on components increases
Solution Approach 1:
The patent transitions from a single-point contact configuration to a multi-dimensional engagement system. The protruding contact pad features engage with corresponding recesses in multiple directions (bottom surface and sidewalls), distributing the contact force across multiple contact points and reducing stress on individual components while maintaining reliable contact during movement.
3Quantity of substance
If miniaturization is pursued to increase data storage capacity, then storage density improves, but manufacturing precision requirements increase and operational yield decreases
Solution Approach 1:
The patent divides the contact pad into segmented functional regions: a protruding portion for male engagement and corresponding recesses in the probe tip for female engagement. This segmentation allows each feature to be optimized independently for its specific function, reducing the cumulative tolerance stack-up that would affect a monolithic contact structure and enabling miniaturization while maintaining manufacturing feasibility.
Data Source
AI summary
A data storage device may be tested during or after manufacture by a testing device that may have at least a work piece with at least one contact pad concurrently contacting bottom and sidewall surfaces of a probe tip with a centering feature of the at least one contact pad.