Laminated Ceramic Capacitor High-Void Core Stress Buffering

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional laminated ceramic capacitors experience delamination and residual stress during the sintering process, which can lead to cracking when exposed to thermal impacts, such as reflow soldering or temperature changes, due to non-uniform thermal expansion of unsintered layered conductors and ceramic green sheets.

Innovation Solution

Incorporating a high-void-ratio part within the cylindrical ceramic part of the sintered chip, with at least two layered parts facing each side of the layered conductors, to act as a stress buffer and diffuser, reducing the transmission of stress to the surrounding ceramic parts and preventing crack generation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional sintering process is used with uniform ceramic green sheets, then manufacturing simplicity is maintained, but delamination and residual stress occur during sintering leading to cracks under thermal impact

Engineering Contradiction:
Improvecrack resistanceVSAvoidceramic structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies local quality by creating a ceramic green sheet with non-uniform binder distribution, where the binder concentration varies through the thickness direction. Specifically, the binder content is higher in the central region compared to the surface regions, creating a gradient structure that generates controlled voids during sintering. This local variation in binder quality allows the central portion to act as a stress buffer while maintaining overall structural integrity, directly resolving the contradiction between reliability and structural complexity.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent utilizes porous materials by intentionally creating a void phase within the ceramic body through non-uniform binder distribution. The voids, formed where binder disappears during sintering, create a porous structure in the central region that serves as a stress buffer. This porous architecture absorbs and diffuses thermal stress, preventing crack propagation while maintaining the external dimensional integrity of the ceramic component.

Inventive Principle:
Principle #31Porous materials

2Reliability

If binder content is increased throughout the entire ceramic green sheet, then stress buffering capacity improves, but structural strength and dimensional stability deteriorate

Engineering Contradiction:
Improvestress buffering capacityVSAvoidstructural strength
Core Design Contradiction:
ReliabilityVSStrength

Solution Approach 1:

The patent resolves this contradiction by applying local quality through spatially selective binder distribution. Instead of uniformly increasing binder content throughout the entire ceramic green sheet, the binder is concentrated specifically in the central region while maintaining lower content at the surfaces. This localized approach provides stress buffering capacity exactly where thermal stress concentrates (in the interior) without compromising the structural strength and dimensional stability provided by the surface regions.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent applies parameter changes by varying the binder concentration parameter through the thickness direction of the ceramic green sheet. The binder content parameter transitions from lower values at the surfaces to higher values in the central region, creating a gradient structure. This parameter variation allows optimization of both stress buffering (via higher binder in center) and structural strength (via lower binder at surfaces), resolving the contradiction between these two properties.

Inventive Principle:
Principle #35Parameter changes

3Ease of manufacture

If delamination occurs at interfaces during sintering, then manufacturing process remains simple, but stress transmission increases leading to crack generation under thermal impact

Engineering Contradiction:
Improvesintering process simplicityVSAvoidstress transmission
Core Design Contradiction:
Ease of manufactureVSObject-affected harmful factors

Solution Approach 1:

The patent applies blessing in disguise by converting the potentially harmful effect of binder disappearance during sintering into a beneficial stress-buffering void structure. Instead of preventing binder removal (which would maintain simplicity but create stress concentration), the invention strategically places binder in the central region where its disappearance creates voids that absorb and diffuse stress. This transforms the harmful stress concentration effect into a beneficial stress diffusion mechanism, reducing crack risk while maintaining manufacturing simplicity.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Solution Approach 2:

The patent uses local quality to prevent harmful stress transmission by creating a localized void structure in the central region. This localized porosity acts as a stress buffer that intercepts and diffuses thermal stress before it can propagate through the entire ceramic body. The surface regions maintain dense, strong structure for structural integrity, while the central porous region absorbs stress, thereby reducing overall stress transmission without complicating the manufacturing process.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The high-void-ratio part effectively suppresses stress transmission and prevents crack formation in the sintered chip during thermal events, enhancing the reliability and durability of the laminated ceramic capacitor by diffusing and buffering stress, while maintaining humidity and thermo-cycle resistance.

Implementation Method 1

the high-void-ratio part effectively suppresses stress transmission and prevents crack formation in the sintered chip during thermal events, enhancing the reliability and durability of the laminated ceramic capacitor by diffusing and buffering stress

Methodology Applied
Scientific EffectStress diffusion:

Implementation Method 2

Incorporating a high-void-ratio part within the cylindrical ceramic part of the sintered chip, with at least two layered parts facing each side of the layered conductors, to act as a stress buffer and diffuser

Methodology Applied
Scientific EffectThermal stress buffering:

Data Source

PatentUS9368281B2Laminated ceramic electronic component
Publication Date: 2016.06.14 TAIYO YUDEN KK
  • US9368281B2 patent drawing
  • US9368281B2 patent drawing
  • US9368281B2 patent drawing

AI summary

In a laminated ceramic capacitor, a cylindrical ceramic part of its ceramics includes, in a manner not exposed to the surface of the ceramics, a cylinder-shaped high-void-ratio part which has a void ratio higher than the void ratio in the cylindrical ceramic part other than the high-void-ratio part and which has two layered parts facing the left and right sides of each layered conductor, respectively, as well as two layered parts facing the outer surfaces of the two outermost layered conductors, respectively. The laminated ceramic electronic component inhibits cracking of its sintered chip.