Correlated Electron Switch Memory for Stable Low-Power Operation

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Solution Overview

Problem

Current non-volatile memory technologies face challenges in achieving low power, high speed, high density, and scalability below 65 nanometers, with existing resistance switching mechanisms being unstable, temperature-dependent, and prone to fatigue, limiting their suitability for commercial use.

Innovation Solution

The development of a Correlated Electron Switch (CES) element that utilizes a quantum mechanical Mott transition to abruptly switch between conductive and insulative states, controlled by specific voltage and current signals, allowing for deterministic and stable resistive switching without the need for electroforming.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If resistance switching mechanisms are used in non-volatile memory devices, then write/read speed and endurance are improved, but stability and temperature dependence worsen

Engineering Contradiction:
Improvewrite/read speedVSAvoidstability
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent changes the fundamental physical mechanism from classical resistance switching to quantum mechanical Mott transition. By adjusting parameters such as applying specific voltage thresholds and controlling electron correlation effects, the system achieves both fast switching speeds and temperature-independent stable states, resolving the contradiction between speed and stability

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent substitutes the mechanical/thermal resistance switching mechanism with a quantum mechanical Mott transition mechanism. This replacement eliminates temperature-dependent stochastic behavior while maintaining fast switching characteristics, thereby improving both speed and reliability simultaneously

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Quantity of substance

If flash memory devices are used to achieve high density, then bit density is improved, but scalability below 65 nanometers worsens

Engineering Contradiction:
Improvebit densityVSAvoidscalability
Core Design Contradiction:
Quantity of substanceVSEase of manufacture

Solution Approach 1:

The patent changes the physical mechanism from phase change or filament formation to Mott transition, which occurs at the nanoscale through electron correlation effects. This enables memory cells to be scaled below 65 nanometers while maintaining high bit density, as the quantum mechanical effect does not require large-scale structural changes

Inventive Principle:
Principle #35Parameter changes

3Speed

If ReRAM/CBRAM devices are used for variable resistance memory, then speed is improved, but fatigue and stochastic behavior worsen

Engineering Contradiction:
Improvewrite/read speedVSAvoidendurance
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent replaces the stochastic filament formation mechanism with a deterministic Mott transition. The quantum mechanical nature of the Mott transition provides well-defined switching thresholds and eliminates random filament formation, thereby achieving both fast switching and high endurance without fatigue

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The Mott transition mechanism is self-regulating through electron correlation effects. When the critical electron density is reached, the transition occurs automatically without requiring external control of filament formation, eliminating stochastic behavior and improving reliability while maintaining speed

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The CES element provides a scalable, low-power, high-speed, and high-density memory solution with improved stability and endurance, capable of transitioning between multiple distinguishable impedance states, expanding its usefulness beyond binary storage.

Implementation Method 1

The CES element may be placed in an insulative or high impedance memory state in response to a Mott transition

Methodology Applied
Scientific EffectMott transition:

Data Source

PatentUS10714175B2Method, system and device for testing correlated electron switch (CES) devices
Publication Date: 2020.07.14 ARM LTD
  • US10714175B2 patent drawing
  • US10714175B2 patent drawing
  • US10714175B2 patent drawing

AI summary

Disclosed are methods, systems and devices for operation of correlated electron switch (CES) devices. In one aspect, a CES device may be placed in any one of multiple impedance states in a write operation by controlling a current and a voltage applied to terminals of the non-volatile memory device. In one implementation, a CES device may be placed in a high impedance or insulative state, or two more distinguishable low impedance or conductive states.