Charge Flow Circuit for Time Measurement Using Series Capacitors
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Solution Overview
Problem
Existing electronic circuits for time measurement that rely on capacitive storage elements face challenges in retaining electric charges for an extended period without a power supply, as the discharge speed is heavily influenced by the thickness of the leakage region, which is difficult to control within current manufacturing processes, leading to short time measurement capabilities.
Innovation Solution
A charge flow circuit comprising a series of capacitive elements with a dielectric layer of varying thickness, allowing for controlled charge retention and leakage, formed using existing semiconductor chip manufacturing processes without additional steps, enabling a longer time measurement period.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Duration of action of moving object
If a single capacitive storage element with a leakage region is used, then the discharge speed can be controlled, but the time measurement duration is limited to a very short period due to manufacturing constraints on dielectric layer thickness
Solution Approach 1:
The patent divides a single capacitive storage element into multiple capacitive elements connected in series, each with its own dielectric layer. This segmentation allows the total voltage to be distributed across multiple layers, enabling longer time measurement durations without requiring any single dielectric layer to be excessively thick, which would be difficult to manufacture.
Solution Approach 2:
The patent transitions from controlling time measurement duration through a single dimension (dielectric layer thickness) to using multiple dimensions (number of series-connected capacitive elements, voltage distribution across elements). This dimensional change allows achieving long measurement times while maintaining manufacturable dielectric layer thicknesses.
2Speed
If the dielectric layer thickness is decreased to increase charge leakage, then the discharge speed increases, but the time measurement duration becomes too short for practical applications
Solution Approach 1:
The patent introduces dynamic control of charge discharge speed through a control circuit that can adjust the voltage applied to each capacitive element. This allows the discharge speed to be dynamically regulated, enabling the system to adapt between faster discharge (for shorter measurements) and slower discharge (for longer measurements) based on application requirements.
Solution Approach 2:
The patent changes the operating parameters of the capacitive elements by applying different voltages to each element in the series connection. By varying the voltage across individual elements, the discharge characteristics can be tuned to achieve desired measurement durations without changing the physical structure or dielectric thickness.
3Reliability
If additional manufacturing steps are introduced to create precise leakage regions, then the charge retention control improves, but the chip manufacturing cost increases
Solution Approach 1:
The patent designs the capacitive elements to be formed using the same manufacturing processes as other standard components on the chip. The capacitive elements serve multiple functions: they store charge for time measurement and can be integrated with existing memory or logic circuit fabrication processes, eliminating the need for specialized additional manufacturing steps.
Solution Approach 2:
The capacitive elements are designed to automatically perform charge retention and discharge functions through their inherent electrical properties, without requiring additional control mechanisms or specialized processing. The series connection configuration and voltage distribution naturally regulate the discharge process, making the system self-regulating and reducing manufacturing complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution allows for a significant extension of time measurement duration, potentially up to several hours or days, by controlling the discharge speed of the capacitive storage element, even when the power is off, through the use of a series-connected capacitive elements with optimized dielectric layers, enhancing the circuit's functionality in applications requiring prolonged time tracking.
Implementation Method 1
said dielectric layer comprising at least one region of smaller thickness capable of letting charges flow by tunnel effect
Data Source
AI summary
A charge flow circuit for a time measurement, including a plurality of elementary capacitive elements electrically in series, each elementary capacitive element leaking through its dielectric space.