Charge Pump Voltage System for DRAM Testing
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Solution Overview
Problem
Existing charge pump systems operate in a single voltage domain, failing to function when the required supply voltage and current are not simultaneously available, leading to operational issues in dynamic random access memory (DRAM) devices during testing and user operation.
Innovation Solution
A charge pump system comprising a first pump circuit operating in a first voltage domain and a second pump circuit operating in a second, lower voltage domain, with a control device selectively enabling one of the circuits based on the operating environment to provide a pump voltage, allowing flexibility in supply voltage and current requirements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a charge pump circuit operates in a single voltage domain requiring 1.8V supply voltage and 50 mA current, then it can provide stable pump voltage for DRAM operation, but it fails to function when the required supply voltage and current are not simultaneously available during testing or operation
Solution Approach 1:
The charge pump system is divided into multiple independent pump circuits, each operating in a different voltage domain (first voltage domain with 1.8V supply, second voltage domain with lower supply voltage). This segmentation allows the system to select the appropriate pump circuit based on available supply conditions, resolving the contradiction between operational reliability and voltage domain adaptability.
Solution Approach 2:
The system dynamically selects which pump circuit to operate based on the available supply voltage and current conditions. The control mechanism enables switching between different voltage domains, making the system adaptable to varying operational environments while maintaining reliable pump voltage generation.
2Adaptability or versatility
If the charge pump system uses multiple pump circuits operating in different voltage domains, then it gains flexibility in supply voltage and current requirements, but the device complexity increases
Solution Approach 1:
Multiple pump circuits are designed with identical circuit structures, allowing them to perform the same function (pump voltage generation) but in different voltage domains. This universal design approach enables voltage domain flexibility while minimizing the increase in device complexity, as the additional complexity is limited to duplicating the proven circuit structure rather than designing fundamentally different circuits.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the charge pump system to function even when the standard 1.8V supply voltage and 50 mA current are not simultaneously available, facilitating DRAM testing and operation by switching to a lower voltage domain, thereby ensuring the characteristics of the DRAM can be tested and the device can be operated.
Implementation Method 1
charge pump circuits are utilized to generate a positive pumped voltage having an amplitude greater than that of a positive supply voltage, or to generate a negative pumped voltage from the positive supply voltage
Data Source
AI summary
The present disclosure provides a charge pump system and a method of operating the same. The charge pump system includes a first pump circuit, a second pump circuit and a control device. The first pump circuit is configured to operate in a first voltage domain. The second pump circuit is configured to operate in a second voltage domain different from the first voltage domain. The control device is configured to selectively enable one of the first pump circuit and the second pump circuit based on an operating environment, wherein the one of the first pump circuit and the second pump circuit provides a pump voltage.