Charged Particle Scanner for Material Discrimination
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Solution Overview
Problem
Current X-ray scanning technologies have limited material discrimination capabilities, leading to high false alert rates and missed threats due to their inability to measure multiple material properties, resulting in inefficient security checkpoint operations.
Innovation Solution
The use of charged particle scanners that measure multiple coulomb scattering and attenuation of charged particles to create a 3D map of atomic number and density, enabling better material discrimination and automated threat detection through a system comprising a charged particle source, beam distribution system, particle tracking detectors, and a calorimeter.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If X-ray scanning technology is used, then imaging capability is provided, but material discrimination capability is limited
Solution Approach 1:
The charged particle scanner performs multiple measurement functions simultaneously: it measures scattering angles to determine atomic number and measures energy loss to determine density. This multi-functional approach enables comprehensive material discrimination (identifying both atomic number and density) using a single scanning system, rather than requiring separate specialized devices for each measurement type.
Solution Approach 2:
The system changes the measurement parameters by detecting different physical quantities during particle traversal: scattering angle (related to atomic number) and energy loss (related to density). By measuring multiple parameters simultaneously, the system achieves superior material discrimination capability compared to single-parameter X-ray imaging.
2Measurement precision
If single-energy X-ray imaging is used, then scanning speed is maintained, but detection accuracy is limited
Solution Approach 1:
The charged particle beam continuously traverses the object while simultaneously collecting scattering angle data and energy loss data. This continuous dual-parameter measurement process maintains high scanning speed while improving detection accuracy, as both measurement types occur during the same traversal without requiring separate scanning passes.
3Measurement precision
If dual-energy X-ray imaging is used, then some material discrimination is improved, but false alert rate remains high
Solution Approach 1:
The system replaces the X-ray imaging mechanism with charged particle traversal and detection. Instead of using X-ray attenuation at different energies, the system uses charged particle scattering and energy loss measurements, which provide more direct and accurate material property information (atomic number and density), thereby reducing false alerts.
4Measurement precision
If multiple measurement parameters are collected, then material classification accuracy is improved, but data processing complexity increases
Solution Approach 1:
The charged particles themselves serve as both the probing mechanism and the measurement carriers. As particles traverse the object, they naturally undergo scattering and energy loss that encode material property information. The system captures these self-generated signals directly, eliminating the need for complex external measurement setups and simplifying the overall measurement and processing architecture.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces false alarm rates, improves throughput, and lowers staffing requirements at security checkpoints by providing a more accurate and efficient method for material classification and threat detection, with lower operational and maintenance costs compared to X-ray tomography.
Implementation Method 1
scanning or screening technology is represented by single-energy or dual-energy X-ray imaging in two dimensions (2D). However, X-rays can have limited material discrimination capability
Implementation Method 2
X-rays can measure only a single material property—the X-ray absorption coefficient
Implementation Method 3
the charged particle detectors comprise scintillating fibers coupled with silicon photomultiplier sensors
Data Source
AI summary
A volume interrogation system can use an accelerated beam of charged particles to interrogate objects using charged-particle attenuation and scattering tomography to screen items such as electronic devices, packages, baggage, industrial products, or food products for the presence of materials of interest inside. The apparatus, systems, and methods in this patent document can be employed in checkpoint applications to scan items. Such checkpoint applications can include border crossings, mass transit terminals (subways, buses, railways, ferries, etc.), and government and private-sector facilities.