Chip Scale Package With Inorganic Insulating Coating

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Traditional plastic semiconductor packages are unsuitable for space-restricted applications due to their thickness and the risk of short circuits between semiconductor die contacts and the solder pads during mounting, leading to potential device failure from unwanted electrical contact and leakage currents.

Innovation Solution

A semiconductor chip scale package with inorganic insulating material, such as aluminum oxide (Al2O3) or alternating layers of Al2O3 and TiO2, applied to the side walls and major surfaces of the semiconductor die using atomic layer deposition or low-temperature PECVD, ensuring electrical isolation and protection without covering the electrical contacts, allowing direct surface mounting on a carrier.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Strength

If traditional plastic packaging is used to encapsulate semiconductor dies, then the dies are protected against damage, but the package thickness becomes too large (10 μm to several 100 μm) for space-restricted applications

Engineering Contradiction:
Improveprotection against damageVSAvoidpackage thickness
Core Design Contradiction:
StrengthVSLength of stationary object

Solution Approach 1:

The patent replaces traditional thick plastic epoxy molding compound with a thin film ceramic coating applied directly to the semiconductor die. This ceramic layer provides the necessary mechanical protection and environmental sealing while maintaining a thickness of only a few micrometers, enabling chip-scale packaging that meets space-restricted application requirements.

Inventive Principle:
Principle #30Flexible shells and thin films

2Volume of stationary object

If the semiconductor die surfaces and side walls are left unprotected to achieve chip scale package size, then the package volume is nearly identical to the die volume, but the unprotected surfaces create short circuit risks between contacts and solder pads during mounting

Engineering Contradiction:
Improvepackage volumeVSAvoidelectrical isolation
Core Design Contradiction:
Volume of stationary objectVSReliability

Solution Approach 1:

The patent applies insulating ceramic material selectively to specific regions of the semiconductor die - covering the side walls and upper surfaces while leaving the solder pad contact areas exposed. This localized application provides electrical isolation where needed to prevent short circuits during mounting, while maintaining direct contact between the solder pads and mounting board for proper electrical connection.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The ceramic coating acts as an intermediary insulating layer between the semiconductor die and the mounting environment. It provides electrical isolation and environmental protection for the die surfaces and side walls, while the exposed solder pads serve as intermediaries for making controlled electrical connections to the mounting board without unwanted current paths.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution provides enhanced electrical isolation, mechanical protection, and hermeticity while maintaining the package volume identical to the die, preventing unwanted current paths and ensuring reliable device performance in space-constrained environments.

Implementation Method 1

applied to the side walls and major surfaces of the semiconductor die using atomic layer deposition

Methodology Applied
Scientific EffectAtomic layer deposition: Physical Vapour Deposition

Implementation Method 2

applied to the side walls and major surfaces of the semiconductor die using atomic layer deposition or low-temperature PECVD

Methodology Applied
Scientific EffectPlasma enhanced chemical vapor deposition: Plasma Enhanced Chemical Vapour Deposition

Data Source

PatentUS11315847B2Chip scale package
Publication Date: 2022.04.26 NEXPERIA BV
  • US11315847B2 patent drawing
  • US11315847B2 patent drawing
  • US11315847B2 patent drawing

AI summary

The disclosure relates to chips scale packages and methods of forming such packages or an array of such packages. The semiconductor chip scale package comprises: a semiconductor die, comprising: a first major surface opposing a second major surface; a plurality side walls extending between the first major surface and the second major surface; a plurality of electrical contacts arranged on the second major surface of the semiconductor die; and an inorganic insulating material arranged on the plurality of side walls and on the first major surface.