On-Chip Timing Calibration Using Closed-Loop Oscillator Paths

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Solution Overview

Problem

High-speed integrated circuits face challenges in meeting setup and hold time specifications due to varying delays caused by process, voltage, and temperature variations, which can lead to malfunction and meta-stability issues, especially as clock frequencies increase and timing margins become more sensitive.

Innovation Solution

The integration of a calibration circuitry within the IC that forms closed-loop oscillator circuits using feedback propagation paths and logic chains to measure and adjust oscillation frequencies, allowing for verification and adjustment of timing constraints, such as setup and hold times, by adjusting delay elements to meet predefined timing specifications.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If clock frequency is increased to improve circuit performance, then productivity is improved, but timing margins become more sensitive and reliability deteriorates

Engineering Contradiction:
Improveclock frequencyVSAvoidtiming constraint satisfaction
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent performs delay calibration measurements before the IC is fully operational, during a dedicated calibration phase. The calibration circuitry pre-determines the actual delays of logic chains and computes compensation values that are stored for later use. This preliminary action allows the system to account for PVT variations before they affect normal operation at high clock frequencies.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements a feedback mechanism where the calibration circuitry measures actual signal path delays, compares them against expected values, and adjusts delay elements accordingly. The system continuously monitors timing constraints and makes real-time adjustments to delay calibration elements to maintain setup and hold time requirements even as operating conditions change.

Inventive Principle:
Principle #23Feedback

2Reliability

If delay calibration circuitry is added to measure and adjust timing delays, then reliability is improved, but device complexity increases

Engineering Contradiction:
Improvetiming constraint satisfactionVSAvoidcircuit structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent combines the calibration circuitry with the existing functional logic chains of the IC. The calibration circuitry shares resources such as logic gates, interconnects, and delay elements with the functional paths. By merging calibration and functional circuits, the patent reduces the additional complexity that would arise from completely separate calibration structures.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent designs the calibration circuitry to serve multiple purposes: it can calibrate delay elements, measure signal path delays, and verify timing constraints. The same circuit structures are used both for normal functional operation and for calibration measurements, making the calibration infrastructure universal rather than dedicated solely to calibration functions.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Adaptability or versatility

If in-situ calibration measurements are performed during normal operation, then adaptability is improved, but productivity decreases due to operational interruptions

Engineering Contradiction:
ImprovePVT variation compensationVSAvoidoperational efficiency
Core Design Contradiction:
Adaptability or versatilityVSProductivity

Solution Approach 1:

The patent implements periodic calibration cycles where the IC alternates between functional operation mode and calibration measurement mode. During periodic calibration intervals, the calibration circuitry performs delay measurements and adjustments. This periodic approach allows the system to adapt to PVT variations over time while maintaining productive operation during the intervals between calibration cycles.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The patent performs comprehensive delay calibration measurements during dedicated calibration phases before normal operation begins. By pre-determining the delays of all logic chains and computing compensation values in advance, the system reduces the need for frequent interruptions during operational phases, thereby minimizing productivity impact while still achieving adaptability.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11764763B1Method and apparatus for in-situ on-chip timing
Publication Date: 2023.09.19 APPLE INC
  • US11764763B1 patent drawing
  • US11764763B1 patent drawing
  • US11764763B1 patent drawing

AI summary

An Integrated Circuit includes a target circuit, first and second logic chains, a feedback path and calibration circuitry. The target circuit includes first and second inputs. The first and second logic chains propagate a signal from a common input point to the first and second inputs of the target circuit, respectively. The feedback path receives the signal from the first or second input and feeds the signal back to the common input point. The calibration circuitry is configured to connect the first input to the feedback path thereby forming a first closed-loop oscillator circuit, and measure a first oscillation frequency of the first closed-loop oscillator circuit, connect the second input to the feedback path, thereby forming a second closed-loop oscillator circuit, and measure a second oscillation frequency of the second closed-loop oscillator circuit, and verify a timing constraint responsively to the first and second oscillating frequencies.