Circuit Fault Detection via Cone of Influence Intersection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current methods for evaluating and analyzing circuit designs are incomplete and cost-prohibitive, particularly in detecting latent faults and failure modes that span multiple hierarchies of an IC design, leading to inaccurate risk assessment and lack of traceable evidence.
Innovation Solution
The method involves determining cones of influence for safety circuit devices within the IC design to identify detectable and undetectable dangerous faults, as well as safe faults, and using these determinations to assess diagnostic coverage and improve safety analysis and fault performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If current methods for evaluating and analyzing circuit designs are used, then safety analysis can be performed, but the analysis is incomplete and cost-prohibitive
Solution Approach 1:
The patent segments the circuit design into multiple hierarchies (top-level module, sub-module, and circuit element levels). By dividing the safety analysis into these discrete segments, the method achieves comprehensive coverage without requiring monolithic complex analysis, thus improving completeness while managing complexity through structured decomposition.
Solution Approach 2:
The patent introduces a hierarchical dimension to the safety analysis by analyzing circuits at multiple levels (top-level, sub-module, and element levels). This dimensional approach allows the analysis to capture faults spanning multiple hierarchies without exponentially increasing complexity, as each level can be analyzed independently and systematically.
2Measurement precision
If current methods are used to detect latent faults, then some faults can be identified, but the detection is inaccurate and lacks traceable evidence
Solution Approach 1:
The patent implements feedback mechanisms where diagnostic coverage metrics are calculated and used to identify undetected dangerous faults. The analysis feeds back into the design by providing traceable evidence of which faults are detectable and which are not, enabling continuous improvement of safety analysis accuracy through measurable feedback loops.
Solution Approach 2:
The patent performs preliminary safety analysis during the design phase rather than after manufacturing. By conducting cone of influence analysis and diagnostic coverage calculation before the circuit is fabricated, the method provides traceable evidence of potential faults early in the design process, enabling corrections before production and improving overall detection accuracy.
3Reliability
If additional safety circuit devices are added to detect faults, then fault detection capability improves, but device complexity increases
Solution Approach 1:
The patent makes existing diagnostic circuits multi-functional by analyzing their cone of influence to determine what faults they can detect. Instead of adding dedicated detection circuits for each fault type, the method evaluates the universal detection capability of existing circuits across multiple fault scenarios, improving detection capability without proportionally increasing circuit complexity.
Solution Approach 2:
The patent calculates diagnostic coverage to identify the partial detection capability of safety circuits. By determining exactly what portion of dangerous faults each circuit can detect (rather than assuming complete coverage), the method identifies gaps that need addressing while avoiding the excessive addition of redundant safety circuits, thus balancing detection improvement with complexity management.
Data Source
AI summary
A method for determining fault types in a circuit design includes obtaining circuit elements, a first observation point of a first circuit element, and a first diagnostic point of a first safety circuit device. The method further includes determining a first cone of influence including a first subset of the circuit elements based on the first observation point. The first subset of the circuit elements includes the first circuit element. Further, the method includes determining a first safety cone including a second subset of the circuit elements based on the first diagnostic point. The first safety cone includes the first safety circuit device. The method further includes determining a fault type associated with the circuit elements based on an intersection between the first cone of influence and the first safety cone.