Cleaning Assembly for Wafer Suction Surface Maintenance
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Solution Overview
Problem
Foreign matter adhering to the suction surface of a conveying unit in a processing apparatus can damage wafers during processing, as it gets sandwiched between the chuck table and the suction surface.
Innovation Solution
A cleaning assembly with a substrate and a cleaning member, such as a sponge or brush, is used to clean the suction surface of the conveying unit, preventing foreign matter from adhering and thus protecting the wafers from damage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a suction surface is used to convey wafers, then wafer conveyance reliability is improved, but foreign matter adheres to the suction surface causing wafer damage
Solution Approach 1:
The cleaning member is positioned to contact the suction surface before wafer placement, performing preliminary cleaning action to remove foreign matter adhering to the suction surface, thereby preventing wafer damage while maintaining conveyance reliability
Solution Approach 2:
A cleaning member acts as an intermediary element between the suction surface and the wafer, contacting the suction surface to remove foreign matter without directly contacting the wafer, thus preventing foreign matter damage to wafers
2Object-affected harmful factors
If the suction surface is cleaned frequently, then foreign matter adhesion is reduced, but device complexity increases
Solution Approach 1:
The cleaning assembly is designed to be self-contained with the cleaning member integrated on the substrate, allowing the suction surface to be cleaned without requiring external cleaning equipment or complex mechanisms, thus reducing overall device complexity while maintaining effective cleaning
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Prevents wafer damage by effectively removing foreign matter from the suction surface, ensuring safe conveyance and processing of wafers.
Implementation Method 1
a suction surface including a plate-like porous member for sucking the back surface of the wafer
Implementation Method 2
a cleaning member disposed on an upper surface of the substrate. The suction surface of the conveying unit is cleaned by an action of the cleaning member
Data Source
AI summary
A cleaning assembly includes a substrate having a lower surface to be held on a holding unit disposed in a processing apparatus and a cleaning member disposed on an upper surface of the substrate. A suction surface of a conveying unit is cleaned by an action of the cleaning member in a state in which the cleaning assembly is held on the holding unit.


