Clock Domain Speed Binning Using Replica Delay Measurement
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Solution Overview
Problem
Traditional speed binning methods classify entire processing devices into a single speed class, failing to account for variations in clock frequencies across different clock domains within the device, leading to suboptimal performance due to manufacturing process variations.
Innovation Solution
Implementing fine-granularity speed binning by measuring propagation delays in each clock domain and assigning independent clock signals based on the slowest propagation delay, allowing each clock domain to operate at its optimal speed, thereby enabling multiple clock domains within a processing device to run at different clock speeds.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If traditional speed binning classifies the entire device into a single speed class, then device complexity is reduced and ease of manufacture is improved, but processing performance is degraded due to ignoring variations across clock domains
Solution Approach 1:
The patent divides the processing device into multiple clock domains and performs speed binning independently for each domain. Instead of classifying the entire device as a single unit, the system segments the device into functional blocks (such as shader engines, compute units, or memory interfaces) that can be tested and classified separately. This allows each segment to operate at its optimal clock frequency, resolving the contradiction between manufacturing simplicity and performance optimization.
Solution Approach 2:
The patent applies different clock frequencies to different clock domains based on their individual performance characteristics. Rather than imposing a uniform speed class across the entire device, the system assigns locally optimized clock speeds to each domain based on its specific propagation delay measurements. This local quality approach enables high-performance domains to run faster while less critical domains operate at appropriate slower speeds, improving overall device productivity.
2Device complexity
If a single clock speed is applied to the entire device, then device complexity is reduced, but processing efficiency deteriorates due to staggered work completion times
Solution Approach 1:
The patent implements dynamic clock frequency assignment where each clock domain can operate at different clock speeds based on its performance characteristics. The system dynamically manages multiple clock signals distributed to different domains, allowing each domain to be optimized independently. This dynamic approach resolves the contradiction by enabling flexible clock management that improves processing efficiency without requiring overly complex centralized control.
Solution Approach 2:
The patent introduces a clock control mechanism that acts as an intermediary between the clock signal source and various clock domains. This intermediary component (such as a clock distribution network or control logic) manages the complexity of distributing different clock frequencies to different domains, shielding the rest of the system from the complexity while enabling efficient multi-speed operation. The intermediary handles the coordination and synchronization needed for staggered work completion to be managed effectively.
3Ease of operation
If the device operates at a uniform clock speed, then ease of operation is improved, but time waste increases due to work completion staggered by differing actual propagation delays
Solution Approach 1:
The patent performs speed binning and clock frequency determination in advance during device initialization or manufacturing testing. By measuring propagation delays in each clock domain beforehand and pre-configuring appropriate clock frequencies, the system eliminates the need for complex real-time adjustments during operation. This preliminary action resolves the contradiction by establishing optimal clock speeds ahead of time, making operation simple while minimizing time waste from propagation delay variations.
Data Source
AI summary
A technique for fine-granularity speed binning for a processing device is provided. The processing device includes a plurality of clock domains, each of which may be clocked with independent clock signals. The clock frequency at which a particular clock domain may operate is determined based on the longest propagation delay between clocked elements in that particular clock domain. The processing device includes measurement circuits for each clock domain that measure such propagation delay. The measurement circuits are replica propagation delay paths of actual circuit elements within each particular clock domain. A speed bin for each clock domain is determined based on the propagation delay measured for the measurement circuits for a particular clock domain. Specifically, a speed bin is chosen that is associated with the fastest clock speed whose clock period is longer than the slowest propagation delay measured for the measurement circuit for the clock domain.