Clock Injection Circuit Mitigates NBTI Degradation
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Solution Overview
Problem
Semiconductor memory devices operating in low-power modes are susceptible to negative-bias temperature instability (NBTI) degradation due to static data signals, leading to reliability issues and performance degradation, while constantly toggling clock circuitry to prevent this consumes unnecessary power, violating power consumption limits.
Innovation Solution
The implementation of synchronizer circuitry that periodically toggles clock circuitry using a gated clock path scheme with an asynchronous, non-target ODT command, operating on a prescribed on-off duty cycle to mitigate NBTI degradation while preserving power savings.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If clock circuitry is constantly toggled to prevent NBTI degradation, then device reliability is improved, but power consumption increases
Solution Approach 1:
The patent implements periodic clock toggling instead of continuous toggling. The clock signal is enabled only during specific time windows within the low-power mode, allowing circuit components to toggle periodically and mitigate NBTI degradation while minimizing power consumption. This periodic action resolves the contradiction by providing reliability benefits without the continuous power cost of constant clock operation.
Solution Approach 2:
The patent dynamically adjusts clock operation based on operational state. During low-power mode, the clock is selectively enabled only when needed to prevent NBTI degradation, rather than remaining continuously active. This dynamic approach allows the system to adapt clock behavior to current operational requirements, resolving the contradiction between reliability and power consumption.
2Use of energy by moving object
If semiconductor devices remain in static state during low-power mode, then power consumption is reduced, but NBTI degradation increases
Solution Approach 1:
The patent applies periodic clock toggling during low-power mode to prevent circuit components from remaining in static states. By periodically activating the clock signal, the system maintains minimal activity that prevents NBTI degradation while keeping power consumption low. This periodic action resolves the contradiction by eliminating static state susceptibility without requiring continuous power consumption.
Solution Approach 2:
The patent extracts the essential function of clock signaling and applies it only when necessary to prevent NBTI degradation, rather than maintaining continuous clock operation. This selective extraction of clock functionality allows the system to maintain reliability while minimizing power consumption during low-power mode.
3Use of energy by moving object
If low-power mode is implemented to reduce power consumption, then energy efficiency is improved, but device susceptibility to NBTI degradation increases
Solution Approach 1:
The patent implements periodic clock toggling during low-power mode to counteract NBTI degradation susceptibility. The clock signal is activated in periodic intervals to keep circuit components from remaining in static states that are most vulnerable to NBTI. This periodic action resolves the contradiction by providing protection against NBTI degradation while maintaining the low-power mode's energy efficiency benefits.
Solution Approach 2:
The patent applies preliminary clock toggling actions during low-power mode to prevent NBTI degradation before it can occur. By periodically activating the clock signal at the beginning or during low-power mode operation, the system preemptively prevents the static state conditions that lead to NBTI degradation, resolving the contradiction between power savings and degradation susceptibility.
Data Source
AI summary
An exemplary semiconductor device includes an internal clock circuit configured to intermittently enable and disable a clock signal while in a Maximum Power Savings Mode. The duty cycle of the enablement and disablement of the clock signal may be based on susceptibility to negative-bias temperature instability of a component of the semiconductor device. The clock signal may be enabled and disabled via a synchronizer.