CMOS Image Chip LED Projection for Faster Camera Debugging
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Solution Overview
Problem
Conventional CMOS image sensor chips face low debugging efficiency due to reliance on camera imaging images on a display device, which introduces signal delay, especially in experimental setups requiring frequent camera type changes and lens adjustments.
Innovation Solution
A CMOS image chip with integrated light emitting diodes (LEDs) and a photosensitive region, allowing for direct projection of a pattern onto a substrate for clarity observation and lens adjustment, enhancing debugging efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If camera imaging image on display device is used as debug basis, then debugging can be performed, but signal delay occurs during transmission process resulting in lower debugging efficiency
Solution Approach 1:
The patent creates a virtual copy of the optical path by projecting patterns directly onto the substrate and capturing the reflected light through the same lens. This virtual optical path copying eliminates the need for physical camera-image transmission, thereby removing signal delay while maintaining debugging functionality.
Solution Approach 2:
The patent introduces a light source as an intermediary element that projects patterns onto the substrate. This intermediary enables direct optical interaction between the lens and substrate without requiring camera imaging transmission, thus eliminating signal delay in the debugging process.
2Adaptability or versatility
If frequent switch of camera types and replacement of lenses is performed, then experimental requirements can be met, but debugging efficiency and experimental efficiency decrease
Solution Approach 1:
The patent creates a universal debugging interface that works with any camera type and lens combination by projecting patterns directly onto the substrate and capturing reflected light. This multi-functional approach allows the same debugging method to be used regardless of camera or lens changes, eliminating the need for re-debugging and improving experimental efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The method improves debugging efficiency by allowing direct projection and adjustment based on projected patterns, reducing signal delay and enhancing experimental efficiency.
Implementation Method 1
a plurality of light emitting diodes disposed on the circuit layer of the light emitting region and electrically connected to the circuit layer
Implementation Method 2
a plurality of photodiodes disposed on the circuit layer of the photosensitive region and electrically connected to the circuit layer
Data Source
AI summary
The present invention relates to a CMOS image chip, a camera, thereof, and a debugging method thereof. The CMOS image chip of the present invention disposes light emitting diodes in a light emitting region and uses a projection pattern of the light emitting diodes on a substrate to be inspected to determine a photosensitive effective region of the CMOS image chip on the underlay to prevent the issue that the conventional technology uses an image by camera imaging on a display device as debug basis and a camera imaging image has signal delay to result in a low debugging efficiency, which drastically improves a debugging efficiency of the camera.