CMOS Image Sensor Light Reflection Reduction via Grooved Substrate

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Solution Overview

Problem

CMOS image sensing devices suffer from image artifacts due to flare effects caused by light reflection from metal films with high light reflectivity, which degrade image quality.

Innovation Solution

The implementation of an image sensing device structure that includes a semiconductor substrate with grooves and a reflection prevention layer to absorb light, minimizing reflection from the metal film by using through-holes in the pad region to direct incident light to a light absorption structure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a metal film with high light reflectivity is used in the image sensing device, then electrical connection and signal transmission are improved, but light reflection causes flare effects that degrade image quality

Engineering Contradiction:
Improveelectrical connection reliabilityVSAvoidlight reflection causing flare effects
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

A reflection prevention layer is introduced as an intermediary between the incident light and the metal film. This layer has a refractive index between air and the metal film, reducing light reflection through refractive index matching. The layer effectively mediates the optical interaction, allowing the metal film to maintain its electrical function while minimizing its harmful reflective effect.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The high reflectivity of the metal film, which originally causes harmful flare effects, is converted into a beneficial anti-reflective structure. By forming grooves and filling them with reflection prevention material, the structure utilizes the metal film's reflective property in a controlled manner to create an effective anti-reflection mechanism, turning the harmful reflection into a useful optical management feature.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Object-generated harmful factors

If grooves are formed in the semiconductor substrate to reduce light reflection, then light absorption is improved, but device structure complexity increases

Engineering Contradiction:
Improvelight reflection reductionVSAvoidstructure complexity with grooves and through-holes
Core Design Contradiction:
Object-generated harmful factorsVSDevice complexity

Solution Approach 1:

The reflection prevention layer is segmented into multiple regions: some areas fill the grooves completely while other areas form through-holes that extend through the metal film layer. This segmentation allows different portions of the structure to serve different functions - groove-filled areas maximize light absorption while through-hole areas provide electrical connectivity and additional light management, reducing overall structural complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention merges multiple functions into a single integrated structure. The reflection prevention layer simultaneously serves as: (1) an anti-reflective coating, (2) a structural element defining grooves and through-holes, and (3) an electrical connection pathway when combined with the metal film. This merging reduces the need for separate components and simplifies the overall device architecture.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design effectively reduces light reflection from the metal film, minimizing flare effects and improving image quality by ensuring most incident light is absorbed rather than reflected, thereby enhancing imaging detection.

Implementation Method 1

the reflection prevention layer configured to reduce reflection of light incident thereon

Methodology Applied
Scientific EffectLight reflection reduction: Reflection

Implementation Method 2

the light absorption structure is formed to absorb the light received through the at least one through-hole

Methodology Applied
Scientific EffectLight absorption: Absorption (EM radiation)

Implementation Method 3

photosensing pixels that convert light into pixel signals

Methodology Applied
Scientific EffectPhotoelectric conversion: Photoelectric Effect

Data Source

PatentUS11393856B2Image sensing device
Publication Date: 2022.07.19 MIMIRIP LLC
  • US11393856B2 patent drawing
  • US11393856B2 patent drawing
  • US11393856B2 patent drawing

AI summary

An image sensing device capable of minimizing reflection of light incident upon a metal layer is disclosed. The image sensing device includes a semiconductor substrate in which at least one groove is formed, a reflection prevention layer formed over the semiconductor substrate in a manner that the at least one groove is buried by the reflection prevention layer, and a metal layer formed over the reflection prevention layer, and provided with at least one through-hole corresponding to the at least one groove.