CMOS Image Sensor Fabrication Step Height for Uniform Color Filters

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Solution Overview

Problem

The existing methods for fabricating CMOS image sensors suffer from striation issues during the formation of color filters, which affect the uniformity of the color filter layer thickness and subsequently impact pixel performance due to the presence of notches or recesses where the color filter layer accumulates during the spin coating process.

Innovation Solution

The method involves forming a step height instead of a notch or recess at the contact pad location, preventing the color filter layer from accumulating and ensuring accurate alignment for the optical shielding layer, thereby preventing striation and improving pixel performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a notch or recess is formed at the contact pad location, then the color filter layer can be deposited, but the color filter layer accumulates in the notch/recess causing striation and non-uniform thickness

Engineering Contradiction:
Improvecolor filter layer thickness uniformityVSAvoidsubstrate structure complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

Instead of forming a notch or recess at the contact pad location (conventional approach), the invention inverts the approach by forming a protrusion or raised structure. This protrusion prevents the color filter layer from accumulating during spin coating, thereby eliminating striation and achieving uniform thickness without the harmful effects of notches.

Inventive Principle:
Principle #13The other way round (Inversion)

2Manufacturing precision

If the contact pad is exposed during spin coating, then the color filter layer can be formed, but alignment accuracy for the optical shielding layer is compromised

Engineering Contradiction:
Improvealignment accuracyVSAvoidfabrication process simplicity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The invention performs preliminary action by forming the protrusion structure at the contact pad location before the spin coating process. This pre-formed structure serves as an alignment reference that guides the subsequent optical shielding layer formation, ensuring high alignment accuracy while simplifying the overall fabrication process.

Inventive Principle:
Principle #10Preliminary action

3Productivity

If spin coating is used to form the color filter layer, then the process is simple and fast, but striation occurs due to accumulation in notches/recesses

Engineering Contradiction:
Improvecolor filter formation efficiencyVSAvoidcolor filter layer uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The invention applies preliminary anti-action by creating a protrusion structure that pre-prevents the accumulation of color filter layer material during spin coating. This proactive measure counteracts the inherent tendency of material to accumulate in notches or recesses, thereby maintaining both high productivity through spin coating and uniformity of the color filter layer.

Inventive Principle:
Principle #9Preliminary anti-action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach prevents striation and enhances the alignment accuracy, leading to improved yield and performance of the CMOS image sensor by ensuring uniform color filter layer thickness and accurate optical shielding layer formation.

Implementation Method 1

The color filter layer is formed on the substrate by a spin coating step

Methodology Applied
Scientific EffectSpin coating: Spin Coating

Implementation Method 2

performing a first etching process to remove a portion of the first dielectric layer for exposing the contact pad and forming a step height

Methodology Applied
Scientific EffectEtching:

Data Source

PatentUS7807493B2Methods for fabricating a CMOS image sensor
Publication Date: 2010.10.05 UNITED MICROELECTRONICS CORP
  • US7807493B2 patent drawing
  • US7807493B2 patent drawing
  • US7807493B2 patent drawing

AI summary

A method for fabricating a CMOS image sensor includes providing a substrate having a sensor array region and a peripheral region defined thereon, forming at least a contact pad on the substrate of the peripheral region, forming a first dielectric layer covering the contact pad on the substrate, performing a first etching process to expose the contact pad and to form a step height, forming an optical shielding layer on the first dielectric layer, forming a plurality of color filters on the first dielectric layer, sequentially forming a planarizing layer and a plurality of micro-lenses on the first dielectric layer.