CMP Polishing Pad Grooves Extend Lifespan

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Solution Overview

Problem

Conventional CMP polishing pads have a short lifespan, leading to increased slurry consumption and reduced material removal rates, resulting in higher costs due to frequent replacements.

Innovation Solution

A CMP polishing pad with grooves that penetrate through at least 50% of the pad thickness on both surfaces, featuring interlaced or aligned patterns to ensure continuous flow and extended usage, enhancing slurry retention and pad life.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Duration of action of stationary object

If conventional CMP polishing pads are used, then the polishing process can be performed, but the pad lifespan is short requiring frequent replacements

Engineering Contradiction:
Improvepolishing pad lifespanVSAvoidslurry consumption
Core Design Contradiction:
Duration of action of stationary objectVSLoss of substance

Solution Approach 1:

The polishing pad is segmented into multiple functional layers with grooves penetrating through at least 50% of the pad thickness to create distinct zones for slurry distribution, polishing action, and waste removal. This segmentation allows optimized performance in each zone while extending overall pad life

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the polishing pad are given different properties through the grooving pattern, with grooves strategically positioned to control slurry flow paths, retention times, and polishing medium distribution across the pad surface, thereby extending useful life while managing slurry consumption

Inventive Principle:
Principle #3Local quality

2Productivity

If grooves are added to the polishing pad to improve slurry distribution, then polishing performance improves, but the device complexity increases

Engineering Contradiction:
Improvematerial removal rateVSAvoidgroove pattern complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The groove pattern is segmented into repeating modular units that simplify manufacturing while maintaining effective slurry distribution. The grooves are arranged in systematic patterns rather than random configurations, reducing design complexity while preserving productivity benefits

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The groove dimensions, depth (penetrating at least 50% of pad thickness), and spacing are optimized as specific parameters to achieve the desired balance between material removal rate and structural simplicity. These parameter optimizations maintain high productivity without requiring overly complex groove geometries

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS9308620B2Permeated grooving in CMP polishing pads
Publication Date: 2016.04.12 TEXAS INSTRUMENTS INC
  • US9308620B2 patent drawing
  • US9308620B2 patent drawing
  • US9308620B2 patent drawing

AI summary

A polishing pad for polishing a semiconductor wafer or other materials, having grooves in the polishing pad to enhance the usable lifetime of the polishing pad.