Coherent Radiation Surface Sensing for High-Precision 3D Metrology
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Solution Overview
Problem
Current surface sensing technologies face challenges in accurately measuring the location, orientation, and motion of complex surfaces with high precision and scalability, particularly in creating three-dimensional images and dimensional data, due to limitations in illumination methods and range resolution.
Innovation Solution
A surface sensing apparatus utilizing coherent radiation with adjustable wavelength emissions and emission deviation facilities to create distinct illumination states and speckle patterns, combined with sensors and processors to determine speckle shifts and calculate surface parameters, enabling precise measurement of surface height, orientation, and motion.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Length of stationary object
If triangulation or time-of-flight methods are used for surface measurement, then measurement range can be extended, but measurement precision deteriorates
Solution Approach 1:
The patent changes the physical parameter from geometric triangulation or time measurement to optical wavelength measurement. By using coherent radiation with wavelength λ and measuring speckle pattern shifts, the system achieves precision proportional to λ/100 or better, while maintaining extended measurement ranges through the use of phase-unwrapping algorithms and multi-wavelength techniques.
Solution Approach 2:
The patent replaces mechanical or temporal measurement systems (triangulation geometry, time-of-flight timing) with an optical interference-based system. The coherent radiation source creates speckle patterns that encode surface height information through phase relationships, eliminating the need for mechanical scanners or high-speed timing electronics while achieving superior precision.
2Measurement precision
If complex surfaces are measured with high precision, then measurement accuracy improves, but system complexity increases
Solution Approach 1:
The patent employs self-service principles through the natural formation of speckle patterns when coherent radiation illuminates rough surfaces. The surface itself generates the measurement signal through diffuse reflection, eliminating the need for complex external modulators or scanners. The system simply captures the speckle pattern and processes it computationally to extract height information.
Solution Approach 2:
The patent introduces speckle patterns as an intermediary that carries surface height information from the complex surface to the simple sensor. The speckle pattern acts as a mediator that transforms complex surface topology into a measurable intensity distribution, which can then be processed using correlation algorithms to retrieve precise height data.
3Adaptability or versatility
If multiple wavelengths are used to improve measurement capability, then measurement versatility improves, but illumination complexity increases
Solution Approach 1:
The patent merges multiple wavelengths from different coherent radiation sources into a single illumination system. By combining lasers of different wavelengths (e.g., 532nm and 1064nm), the system achieves extended measurement ranges and improved precision simultaneously, while the combined illumination is delivered through a single optical path to the surface.
Solution Approach 2:
The patent creates a universal illumination system that can operate at multiple wavelengths to serve different measurement needs. The same speckle-based measurement apparatus can handle various surface types and range requirements by simply changing the wavelength combination, making the system multi-functional without requiring separate measurement systems for different applications.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for high-precision, low-cost measurements of complex surfaces across various scales, overcoming limitations of triangulation and time-of-flight methods, and enabling applications in industrial inspection, metrology, and three-dimensional imaging.
Implementation Method 1
at least one source of coherent radiation capable of outputting at least one wavelength emission to create a first illumination state
Implementation Method 2
illuminate a surface to create a first speckle pattern
Implementation Method 3
an emission deviation facility capable of influencing the emission to illuminate the surface to create a second illumination state and a second speckle pattern
Data Source
AI summary
Disclosed is a surface sensing apparatus, one embodiment having a source of coherent radiation capable of outputting wavelength emissions to create a first illumination state to illuminate a surface and create a first speckle pattern, an emission deviation facility capable of influencing the emission to illuminate the surface and create a second illumination state and a second speckle pattern, and a sensor capable of sensing a representation of the first and a second speckle intensity from the first and second speckle pattern. Also disclosed are methods of sensing properties of the surface, one embodiment comprising the steps of illuminating the surface having a first surface state with the source of coherent radiation emission, sensing a first speckle intensity from the surface, influencing a relationship of the surface to the emission to create a second surface state and sensing a second speckle intensity from the surface at the second surface state.