Photometry Using Reference Value TRIZ Cases

Introducing a corrective lens between the test element and lenslet array prevents focal spot overlap in highly aberrated wavefront measurements.

Regional light sensors detect luminance to correct video signals, compensating for organic EL brightness reduction and preventing burn-in.

Adjusting threshold voltage per detection area extends LiDAR range while preventing noise-induced errors without adding circuit complexity.

A light beam detection circuit uses a single optical sensor to generate a detection signal for scanning target position.

Time-division multiplexing switches RGB and infrared photodiodes to three shared analog-to-digital converters.

A photosensor light-modifier applies asymmetric weighting to reduce measurement errors from bright objects outside the field of interest.

White light sensor data adjusts PIR thresholds, eliminating false alarms from headlights.

Holding devices mediate radiation measurement to determine opening dimensions without adding sensors.

Optical sensor device detects reflected light intensity to determine cover film presence and surface color.

Linearization functions correct multi-path absorbance signals to extend dynamic range without increasing device complexity or noise.

Replacing bulky telescopes with wafer-based photonic circuits, the device achieves high angular resolution while minimizing size and weight.

Multi-spectral photodiode arrays detect visible and infrared light to determine incident illuminance levels accurately.

Optical alignment apparatus uses subapertures and detectors to measure reflected light intensity for precise segment positioning.

Factory-established dry calibration curves enable rapid single-point measurement of non-volatile analytes without complex multi-media setups.

A surface sensing apparatus uses coherent radiation to create distinct speckle patterns for precise dimensional measurement.

Sequential lighting with feedback control reduces intensity fluctuations across LCD backlight sections.

Integrated detector monitors scattered light intensity to verify optical path status without adding separate hardware.

Segmenting halogen lamps into individual LEDs reduces system size and maintenance while ensuring uniform illumination across CIS device chips.

A spatially variant microreplicated layer directs light at specific incidence angles to tune optical responses.

Phase modulation strategy specifies converging spots without adding components, resolving the contradiction between measurement precision and device complexity.

Tailored impurity profiles in dual photodiodes enable selective UV detection while suppressing visible and infrared interference.

A forward looking light sensor uses a rounded aperture formed by light blocking materials to mimic the cosine squared function.

Screening VCSELs at discrete drive currents identifies unstable polarization zones before deployment.