Color Conversion Panel Alignment Keys for Overlay Precision
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Solution Overview
Problem
Existing display devices face challenges in accurately determining the overlay state of layers within a color conversion display panel, leading to potential manufacturing inaccuracies and reduced reliability due to light loss in liquid crystal display devices and sensitivity to external elements in organic light emitting display devices.
Innovation Solution
Incorporating alignment keys with specific light blocking, layer, and display patterns on a substrate to facilitate precise alignment of layers, allowing for the determination of the overlay state without affecting measurement areas, thereby improving manufacturing accuracy and reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If alignment keys are added to determine overlay state, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The alignment key is segmented into distinct functional patterns: a light blocking pattern for defining boundaries, a layer pattern for reference alignment, and a display pattern for visual verification. This segmentation allows each component to perform its specific function efficiently while contributing to the overall measurement precision without excessive complexity.
Solution Approach 2:
The alignment key acts as an intermediary structure between the manufacturing process and the measurement process. It provides a standardized reference framework that mediates the alignment verification, enabling precise overlay state determination without requiring complex measurement equipment or procedures.
2Manufacturing precision
If multiple patterns are included in alignment key, then manufacturing precision is improved, but ease of manufacture deteriorates
Solution Approach 1:
Multiple patterns (light blocking pattern, layer pattern, and display pattern) are merged into a single integrated alignment key structure that can be fabricated as one unified component. This merging approach maintains high manufacturing precision through consistent alignment references while simplifying the fabrication process by reducing the number of separate manufacturing steps.
Solution Approach 2:
The alignment key is designed with multi-functionality, serving simultaneously as a light blocking structure, a layer alignment reference, and a display verification element. This universal design allows a single structure to perform multiple functions, improving manufacturing precision across different measurement needs while easing the manufacturing burden by eliminating the need for separate components.
3Ease of operation
If display pattern is positioned at corner, then ease of operation is improved, but manufacturing precision may deteriorate
Solution Approach 1:
The display pattern is strategically positioned at the corner of the alignment key where it provides optimal visual accessibility for operators while maintaining precise registration with the layer pattern. This local optimization at the corner position enhances ease of operation for alignment verification without compromising the overall manufacturing precision of the alignment key structure.
Data Source
AI summary
A display device includes: a substrate including an alignment area in a non-display area, and a display area including a plurality of material layers on the substrate; in the alignment area, a plurality of keys including a first alignment key and a second alignment key. Each alignment key includes a light blocking pattern, a layer pattern and a display pattern. The position of the display pattern within the first alignment key is different from the position of the display pattern within the second alignment key, the layer pattern of the alignment key and one material layer among the plurality of material layers are respective portions of a same material layer on the substrate, and the layer pattern of the first alignment key and the layer pattern of the second alignment key are respective portions of different material layers among the plurality of material layers on the substrate.