Column ADC Ripple Counter Layout for Stable High-Speed Image Sensing

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Solution Overview

Problem

Conventional CMOS image sensors face challenges in reducing chip size, preventing count value changes during operation switching, and increasing data transmission speed due to the size and complexity of up/down ripple counters and memory devices.

Innovation Solution

The implementation of a CMOS image sensor with a controller generating specific control signals to manage up/down ripple counters and memory chains, utilizing latches and switch blocks to prevent count value changes and enhance data transmission speed.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a single ADC operating at high speed is used to convert analog pixel signals, then conversion speed is improved, but power consumption increases

Engineering Contradiction:
Improveconversion speedVSAvoidpower consumption
Core Design Contradiction:
ProductivityVSUse of energy by moving object

Solution Approach 1:

The patent divides the single high-speed ADC into multiple column ADCs, each operating at lower speed but collectively achieving the required conversion throughput. Each column ADC processes signals from a specific column of pixels, segmenting the overall conversion task into parallel sub-tasks that consume less power individually while maintaining system-level productivity.

Inventive Principle:
Principle #1Segmentation

2Use of energy by moving object

If multiple column ADCs are used to reduce power consumption, then power consumption is reduced, but chip size increases

Engineering Contradiction:
Improvepower consumptionVSAvoidchip size
Core Design Contradiction:
Use of energy by moving objectVSArea of stationary object

Solution Approach 1:

The patent merges the up/down ripple counter and memory device into an integrated ADC module for each column. This consolidation eliminates the need for separate counter and memory components, reducing the overall chip area while maintaining the power-saving benefits of multiple column ADCs. The integrated design shares common circuitry and resources across the multiple ADCs.

Inventive Principle:
Principle #5Merging (Combining)

3Adaptability or versatility

If up/down ripple counters are used for counting operations, then counting functionality is achieved, but count values change during operation switching

Engineering Contradiction:
Improvecounting functionalityVSAvoidcount value stability
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The patent freezes the count value in advance before switching between up-counting and down-counting operations. By latching the current count value prior to operation switching, the system prevents any transient changes or instability that would occur during the transition, ensuring reliable and stable count values are maintained throughout operation switching.

Inventive Principle:
Principle #10Preliminary action

4Quantity of substance

If conventional memory devices are used to store count values, then data storage is achieved, but data transmission speed is limited

Engineering Contradiction:
Improvedata storage capacityVSAvoiddata transmission speed
Core Design Contradiction:
Quantity of substanceVSSpeed

Solution Approach 1:

The patent introduces a data bus as an intermediary between the integrated ADC module and the external interface. This dedicated data transmission pathway enables high-speed transfer of digital signals and count values without being bottlenecked by conventional memory device read/write speeds, effectively decoupling storage capacity from transmission speed limitations.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS8723997B2Method of operating ripple counter, image sensor having ripple counter, method of operating image sensor, and analog-to-digital converter of image sensor
Publication Date: 2014.05.13 SAMSUNG ELECTRONICS CO LTD
  • US8723997B2 patent drawing
  • US8723997B2 patent drawing
  • US8723997B2 patent drawing

AI summary

An example embodiment of an image sensor may include a controller and a plurality of up/down ripple counters. The controller may generate a first control signal and a second control signal. Each of the up/down ripple counters may perform a stop operation or a count operation in response to a corresponding one of a plurality of operation control signals generated based on at least in part on the first control signal. The count operation may be an up-count operation or a down-count operation based on the second control signal. The image sensor may also include a plurality of memory chains. Each of the memory chains may receive a count value output from the up/down counters and may shift the received count value in response to a third control signal and a fourth control signal output from the controller.