Compact 1-3 MeV Deuteron Cyclotron for Materials Analysis
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
There is a need for a compact cyclotron capable of producing low-energy proton or deuteron beams in the range of 1 MeV to 3 MeV for materials analysis, as existing technologies have limited applications for such low-energy beams in characterizing atomic compositions of industrial materials.
Innovation Solution
A compact proton/deuteron cyclotron system that focuses a negative hydrogen ion or deuteron ion beam onto a target material, inducing (d,*) or (p,*) reactions, with a beam energy ranging from 1 MeV to 3 MeV and a beam current of 5 pA to 100 nA, and utilizes detectors like silicon diode, lithium diode, BGO, or HPGe to analyze radiation emissions for elemental composition.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If a compact cyclotron is designed for low-energy beams (1 MeV to 3 MeV), then the device size and cost are reduced, but the application scope for materials analysis is limited
Solution Approach 1:
The patent applies parameter changes by optimizing the cyclotron to operate at specific low energy levels (1-3 MeV) with precisely controlled beam currents (5 pA to 100 nA). This parameter optimization enables the compact device to achieve sufficient analysis capability for materials characterization despite the reduced energy range, resolving the contradiction between compact size and application effectiveness
2Power
If beam energy is reduced to 1 MeV to 3 MeV range, then the cyclotron becomes more compact and cost-effective, but the beam penetration depth and analysis capability are reduced
Solution Approach 1:
The patent applies partial action by using lower beam energies (1-3 MeV) than traditional high-energy cyclotrons, which is sufficient for analyzing thin film samples and surface materials. The beam current is optimized to 5 pA to 100 nA to provide adequate signal intensity for analysis without requiring high energy, thus achieving cost-effective materials characterization for specific applications
Solution Approach 2:
The invention changes the operating parameters to low energy (1-3 MeV) and controlled beam current (5 pA to 100 nA), which optimizes the balance between compact device size and analysis capability for thin film and surface materials, resolving the contradiction between reduced power and maintained analysis precision
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate characterization of atomic compositions through X-ray or gamma-ray emission spectroscopy and Rutherford backscattering, providing a cost-effective and compact solution for industrial materials analysis.
Implementation Method 1
The path of the accelerated particle is then bent by a magnetic field into a spiral path (due to the Lorentz force perpendicular to their direction of motion)
Implementation Method 2
A cyclotron accelerates a charged particle beam using a high frequency alternating voltage which is applied between two hollow 'D'-shaped sheet metal electrodes called 'dees' inside a vacuum chamber
Implementation Method 3
irradiating the target material to induce (d,*) or (p,*) reactions with the target material thereby resulting in a radiation emission
Implementation Method 4
characterization of atomic compositions through X-ray or gamma-ray emission spectroscopy
Implementation Method 5
Rutherford backscattering, providing a cost-effective and compact solution for industrial materials analysis
Data Source
AI summary
Systems and methods related to the use of a proton/deuteron cyclotron for materials analysis and other industrial applications are provided. The methods, apparatuses and uses include positioning a target material for irradiation on a sample holder, focusing a hydrogen ion beam or a deuteron ion beam, such as a negative hydrogen ion or negative deuteron ion beam, from the cyclotron to the target material, irradiating the target material to induce a (d,*) or a (p,*) reaction thereby producing a radiation emission, and detecting the radiation emission using a detector, wherein the particle beam produced by the cyclotron has an energy in a range of from and including 1 MeV to 3 MeV and has a beam current in a range of from and including 5 pA to 100 nA.