Compact Eddy Current Test Head for Fast Thermal Shocks
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Solution Overview
Problem
Existing cold and hot shock test devices for semiconductors and components are bulky, have slow heating and cooling speeds, high energy consumption, and lack flexibility due to reliance on compressors and traditional refrigeration equipment, limiting their mobility and convenience.
Innovation Solution
A small-sized fast cold and hot shock test device utilizing an eddy current mechanism to control temperature and replace traditional refrigeration equipment, enabling rapid temperature changes from -55°C to 220°C within minutes, with reduced energy consumption and mobility through an adjustable test head and position-adjusting device.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If traditional refrigeration equipment (compressor, evaporator, condenser) is used for cold and hot shock testing, then the device can achieve temperature control, but the heating and cooling speeds are slow and energy consumption is high
Solution Approach 1:
The patent replaces the traditional mechanical refrigeration system (compressor, evaporator, condenser) with an eddy current mechanism that uses electromagnetic induction to directly heat or cool the test component. This substitution eliminates the mechanical compression and phase change processes, enabling rapid temperature transitions with significantly reduced energy consumption.
Solution Approach 2:
The patent changes the fundamental operating parameters of the temperature control system by using eddy currents to generate heat directly in the test component or surrounding medium, rather than relying on refrigerant circulation. This parameter change enables heating and cooling speeds increased by orders of magnitude while reducing energy consumption.
2Ease of operation
If traditional refrigeration equipment is used, then temperature control is achieved, but the device becomes bulky and lacks mobility
Solution Approach 1:
By replacing the bulky mechanical refrigeration system with a compact eddy current mechanism, the patent dramatically reduces the device volume. The eddy current mechanism consists mainly of electromagnetic coils and control electronics, which occupy minimal space compared to compressors, evaporators, and condensers, thereby enabling portability and flexibility.
Solution Approach 2:
The patent extracts and removes the large, heavy components (compressor, evaporator, condenser) from the system, retaining only the essential eddy current generation elements. This extraction of unnecessary bulk components directly enables the device to be small-sized and mobile while maintaining temperature control functionality.
3Adaptability or versatility
If the test component is placed in a fixed position on the test device, then testing can be performed, but the device cannot be positioned with the component, lacking flexibility
Solution Approach 1:
The patent introduces dynamic positioning capabilities where the test component can be moved to different positions relative to the eddy current mechanism, or the mechanism itself can be repositioned. This dynamic adjustment allows the device to adapt to different component sizes, shapes, and testing requirements, significantly improving versatility and convenience.
Solution Approach 2:
The patent designs the eddy current mechanism and positioning system to handle various types of test components in different configurations. The system can accommodate multiple component sizes and shapes through adjustable positioning, making it a universal testing device that improves both adaptability and ease of operation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device achieves fast temperature transitions, reduced energy consumption, and enhanced mobility and flexibility, allowing selective testing without damaging surrounding components, with temperature adjustments taking as little as 12 seconds for common test ranges.
Implementation Method 1
The eddy current mechanism includes an air inlet, a cold air outlet, and a hot air outlet. The air inlet is connected with an air supply system through an intake air line unit. The cold air outlet is connected with the air inlet end of the heater.
Implementation Method 2
a heater including an air inlet end and an air outlet end
Data Source
AI summary
A small-sized fast cold and hot shock test device is provided. The device includes a host, a test head used for cold and hot shock to a component under test by temperature control and output of compressed air, and an adjustment device for adjusting a position of the test head. The host includes a control device at least used to send temperature control data to the test head. The test head includes an eddy current mechanism for cooling or heating the compressed air, a heater including an air inlet end and an air outlet end, and a nozzle. The eddy current mechanism includes an air inlet, a cold air outlet, and a hot air outlet. The air inlet is connected with an air supply system through an intake air line unit. The cool air outlet is connected with the air inlet end of the heater.