Compact FPGA Test System for Harsh Radiation Environments
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Solution Overview
Problem
Current digital electronics test systems are large, expensive, and not portable, making them unsuitable for harsh environments such as high radiation areas, and require custom DUT interface boards, which increases costs and complexity.
Innovation Solution
A compact, programmable digital test system using a Field Programmable Gate Array (FPGA) with a 48-pin DIP footprint, capable of interfacing with various digital components, and adaptable to harsh environments, eliminating the need for custom DUT interface boards and allowing for easy shielding and portability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional digital electronics test systems are used, then testing functionality is achieved, but the systems become large, expensive, and non-portable
Solution Approach 1:
The patent combines multiple test functions and interfaces into a single integrated compact test system. The system merges DUT interface capabilities, testing functions, and control logic into one unified device that fits in a portable form factor, eliminating the need for separate large-scale test equipment while maintaining full testing functionality.
Solution Approach 2:
The test system is designed with universal interfaces and reconfigurable capabilities that allow it to test multiple types of digital components through a single device. The system can adapt to different DUT configurations without requiring custom interface boards, making it both portable and functionally comprehensive.
2Adaptability or versatility
If custom DUT interface boards are created for each device, then specific testing requirements are met, but costs and complexity increase
Solution Approach 1:
The system employs universal interfaces and reconfigurable logic that can adapt to different DUT types without requiring custom interface boards. The programmable architecture allows the same physical device to configure itself for different testing scenarios, eliminating the need for multiple specialized interface boards.
Solution Approach 2:
The test system uses dynamically reconfigurable interfaces that can change their behavior based on the specific DUT being tested. Rather than static custom boards, the system dynamically adjusts its interface configuration through programming, allowing one physical device to serve multiple interface roles.
3Object-affected harmful factors
If extensive shielding is provided for radiation environments, then radiation protection is achieved, but system size and weight increase
Solution Approach 1:
The system is designed as a disposable or easily replaceable unit that can be deployed in radiation environments without requiring heavy permanent shielding infrastructure. The compact nature allows it to be replaced rather than protected, reducing the need for extensive shielding while maintaining operational capability in harsh environments.
Data Source
AI summary
Various apparatus and methods associated with a compact electronics test system having user programmable device interfaces and on-board functions adapted for use in various environments are provided. Exemplary embodiments can include a variety of apparatuses and methods to realize an advanced field programmable gate array adapted to perform functional tests on digital electronics within an exemplary 48-pin DIP footprint. One aspect of the invention can include a testing device comprised of components to produce a product that is inexpensive and consumable. A small size of an exemplary embodiment of the invention further allows for desirable shielding to be placed around a highly portable and highly programmable and adaptable testing device in order to protect it from external dangers found in harsh environments (e.g., high levels of radiation when operating in space, etc.).