Compensated Current Sensing Checking Block for Non-Volatile Memory

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Solution Overview

Problem

Non-volatile memory devices face challenges in accurately verifying the programming of memory cells due to mismatched resistances and internal offsets between the page buffer area and the peripheral reference block, affecting the reliability of programming verification operations.

Innovation Solution

A compensated current sensing checking block is implemented, utilizing a current mirror, programming status input block, reference block, operational amplifier, and switched capacitors to compare voltage levels and compensate for resistance mismatches and internal offsets, ensuring accurate verification of programming failures.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a current sensing checking block is used to verify programming of memory cells, then programming verification can be performed, but resistance mismatch and internal offset between page buffer area and peripheral reference block cause inaccurate verification

Engineering Contradiction:
Improveprogramming verification accuracyVSAvoidvoltage level comparison accuracy
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The patent applies preliminary action by performing offset calibration before the actual programming verification. A calibration sequence is executed where test patterns are written to reference cells, and the resulting voltage levels are measured and stored as calibration data. This preliminary calibration compensates for resistance mismatches and operational amplifier offsets, ensuring that subsequent programming verification uses accurate, compensated voltage levels rather than raw measurements that would be affected by circuit variations.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements feedback by using the calibration results to adjust the verification process. The measured voltage levels from the calibration phase are fed back into the system to determine compensation values. During programming verification, these compensation values are applied to correct the voltage level comparisons, creating a closed-loop system that continuously refines the accuracy of programming status detection based on actual hardware conditions.

Inventive Principle:
Principle #23Feedback

2Ease of manufacture

If resistance mismatch between page buffer area and peripheral reference block is present, then device layout flexibility is maintained, but verification accuracy deteriorates

Engineering Contradiction:
Improvelayout flexibilityVSAvoidvoltage comparison accuracy
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent applies parameter changes by dynamically adjusting the verification parameters based on measured calibration data. Instead of using fixed voltage thresholds that would be affected by resistance mismatches, the system changes the comparison parameters to compensated voltage levels derived from actual calibration measurements. This allows the same physical layout with its inherent resistance variations to achieve accurate verification by adapting the electrical parameters rather than changing the physical structure.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS9543034B2Non-volatile memory and a method of operating the same
Publication Date: 2017.01.10 SK HYNIX INC
  • US9543034B2 patent drawing
  • US9543034B2 patent drawing
  • US9543034B2 patent drawing

AI summary

A non-volatile memory includes a current sensing checking block including a programming status input block comprising a plurality of sub-blocks connected with each other in parallel with respect to a first node; a reference block comprising a plurality of sub-blocks connected with each other in parallel with respect to a second node; an operational amplifier operable to compare voltage levels of the first node and the second node to determine whether a actual number of programming failures for a desired group of cells exceeds a reference number of allowable programming failures of the reference block.