A self-aligned phase change memory array uses damascene processing to define bit and word lines over access devices.
A data sampling circuit module generates a sensing voltage pair from differential signals to output sampling data streams.
A vector operation circuit uses semiconductor switching elements with programmable threshold voltages to control current flow through column lines.
A replica memory cell measures the maximum pulse width required for data writing in spin transfer torque random access memory.
A clamping unit with a transistor and capacitor manages node voltages during precharge cycles in resistive memory devices.
A compensated current sensing checking block compares voltage levels using an operational amplifier and switched capacitors to verify programming status.
Opposing diode varistors enable bipolar resistor operation in RRAM, overcoming unidirectional current limits.
Segmenting the precision loop and buffer circuit with a flying capacitor reduces voltage modulation and drift caused by ground bounce.
Analog content addressable memory circuits encode arbitrary range segments using voltage divider configurations to establish precise upper and lower bounds.
Parallel opposing diodes replace transistors in MRAM cells, reducing area overhead and leakage power consumption while enhancing memory density.
Current adjusters equalize currents against reference values to prevent drift in analog memory cells.
Staggered sense amp strobing isolates power draw fluctuations, reducing supply noise and improving read accuracy.
An ionic transistor and capacitor series structure modulates conductance levels for neuromorphic synaptic simulation.
A resistive memory cell uses dual bias voltages to reset the switching device while protecting the gate switch from damage.