Component Carrier Ultra-Thin Transition Layer for Delamination Control
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Solution Overview
Problem
Component carriers face challenges in assembling components with high reliability due to poor adhesion and thermal mismatch between components and the carrier materials, leading to issues like warpage, delamination, and stress formation.
Innovation Solution
A laminated stack with a transition layer of 0.5 nm to 1 μm thickness, made of materials like Bis(2-methoxyethyl)ether and aromatic polyamideimide, is used to promote adhesion and thermal reliability between the component and the stack, effectively suppressing delamination and stress by acting as a mechanical and thermal buffer.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If components are assembled on component carriers with high functionality and miniaturization, then product functionality and component density are improved, but heat removal becomes increasingly difficult and adhesion reliability deteriorates
Solution Approach 1:
A transition layer is introduced as an intermediary between the component and the laminated stack. This transition layer has a coefficient of thermal expansion that is intermediate between the component and the carrier materials, acting as a buffer to reduce stress and prevent delamination while maintaining assembly reliability under harsh conditions
2Reliability
If transition layer thickness is increased to improve adhesion and thermal reliability, then mechanical and thermal reliability are improved, but component carrier thickness increases
Solution Approach 1:
The transition layer thickness is optimized to a specific range (0.5 nm to 1 μm) to achieve the desired balance. This parameter optimization ensures sufficient adhesion and stress buffering while maintaining a compact overall thickness of the component carrier
3Ease of manufacture
If conventional materials are used without transition layer to maintain compact design, then manufacturing simplicity is maintained, but warpage and delamination occur under thermal stress
Solution Approach 1:
The transition layer serves as a stress-buffering intermediary that prevents warpage and delamination caused by thermal expansion mismatch between components and carrier materials, thereby improving structural stability without significantly complicating the manufacturing process
Data Source
AI summary
A method of manufacturing a component carrier includes providing a laminated stack with at least one electrically conductive layer structure and/or at least one electrically insulating layer structure, at least partially covering a component with a transition layer having a thickness in a range from 0.5 nm to 1 μm, and assembling the component with the stack.


