Concave Dielectric Spacer for Isolated Semiconductor Contacts

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Solution Overview

Problem

As semiconductor devices miniaturize, undesired short-circuits between conductive features become a critical issue due to the close proximity of contact structures and conductive elements, leading to reliability and performance concerns.

Innovation Solution

A semiconductor structure is designed with a dielectric spacer having a concave surface facing the conductive element, creating a network structure that increases the distance between the contact structure and the conductive element, thereby preventing short-circuits and enhancing electrical isolation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the size of semiconductor devices is reduced to achieve miniaturization, then device performance and integration are improved, but the risk of short-circuit between conductive features increases

Engineering Contradiction:
Improvedevice miniaturizationVSAvoidshort-circuit prevention
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

A dielectric spacer structure is introduced as an intermediary element between the contact structure and the conductive element. This spacer creates a physical separation and electrical isolation, preventing direct contact and potential short-circuits while allowing the device to maintain miniaturized dimensions. The spacer acts as a buffer zone that mediates the proximity issue between closely spaced conductive features.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The solution moves from purely planar spacing to three-dimensional spatial separation by introducing a vertically extending dielectric spacer. This adds a vertical dimension to the spacing strategy, allowing horizontal proximity while maintaining vertical isolation through the spacer structure that extends from the substrate surface upward.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If the distance between contact structure and conductive element is increased to prevent short-circuit, then reliability is improved, but device area increases

Engineering Contradiction:
Improveelectrical isolationVSAvoiddevice area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The dielectric spacer utilizes the vertical dimension to achieve electrical isolation rather than relying solely on horizontal spacing. By extending upward from the substrate, the spacer provides effective separation in the Z-direction, allowing the contact structure and conductive element to remain close in the XY-plane without increasing the overall device footprint.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The dielectric spacer functions as a thin film structure that provides effective electrical isolation with minimal material volume. This thin film approach achieves the required insulation distance without requiring large lateral separations, thus maintaining compact device geometry while ensuring reliable electrical isolation.

Inventive Principle:
Principle #30Flexible shells and thin films

3Ease of manufacture

If a simple linear dielectric spacer is used, then manufacturing is easier, but manufacturing precision and tolerance are reduced

Engineering Contradiction:
Improvespacer fabricationVSAvoidspacing control
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The dielectric spacer incorporates a concave curved surface instead of a simple linear or flat geometry. This curved profile provides better tolerance to manufacturing variations and alignment errors, as the curved shape naturally accommodates small dimensional deviations while maintaining the essential spacing function. The curvature also improves the conformal coverage and adhesion to underlying structures.

Inventive Principle:
Principle #14Spheroidality (Curvature)

Data Source

PatentUS20230337411A1Method of manufacturing semiconductor structure having contact structure
Publication Date: 2023.10.19 NAN YA TECH
  • US20230337411A1 patent drawing
  • US20230337411A1 patent drawing
  • US20230337411A1 patent drawing

AI summary

The present disclosure provides a method of manufacturing a semiconductor structure. The method includes providing a semiconductor substrate including an active region and an isolation structure. The method also includes forming a contact structure on the active region of the semiconductor substrate. The method further includes forming a dielectric spacer on opposite sides of the contact structure. The method also includes forming a conductive element on the isolation structure of the semiconductor substrate, wherein the dielectric spacer has a concave surface facing the conductive element.