Conditional Valley Tracking for Memory Read Calibration

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Solution Overview

Problem

Existing memory sub-systems face challenges in accurately reading data due to cell-to-cell interference, which leads to widening of threshold voltage distributions and degradation of read window budget, resulting in increased errors and reduced memory device reliability.

Innovation Solution

Implementing conditional valley tracking during corrective reads, where the controller obtains cell state information for each group of adjacent cells and uses valley tracking to calibrate read level offsets for each bin of target cells, allowing for more accurate reading and improved reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional reading methods are used, then the reading process is simple and fast, but cell-to-cell interference causes widening of threshold voltage distributions and degradation of read window budget, resulting in increased errors

Engineering Contradiction:
Improveread accuracyVSAvoidreading process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent segments the reading process into multiple corrective read iterations, where each iteration reads a subset of memory cells and updates read levels based on observed errors. This segmentation allows the system to improve read accuracy by addressing cell-to-cell interference incrementally, rather than attempting to correct all errors in a single read operation.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements feedback by using the results of each corrective read to update the read levels for subsequent reads. The controller adjusts the read levels based on the threshold voltage distributions observed in previous reads, creating a closed-loop system that continuously improves read accuracy while managing the complexity of the reading process.

Inventive Principle:
Principle #23Feedback

2Measurement precision

If corrective reads are performed to improve read accuracy, then errors are reduced, but the reading time and operational complexity increase

Engineering Contradiction:
Improveread level accuracyVSAvoidreading time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent applies partial action by performing corrective reads only on subsets of memory cells in each iteration rather than reading all cells every time. This approach achieves improved read level accuracy for critical cells while minimizing the overall time loss, as not all cells require the same level of correction in each reading cycle.

Inventive Principle:
Principle #16Partial or excessive action

3Manufacturing precision

If multiple corrective reads are performed to calibrate read levels, then threshold voltage distribution accuracy improves, but the number of operations and energy consumption increase

Engineering Contradiction:
Improvethreshold voltage distribution accuracyVSAvoidenergy consumption
Core Design Contradiction:
Manufacturing precisionVSUse of energy by moving object

Solution Approach 1:

The patent applies preliminary action by performing initial corrective reads to establish accurate read levels before normal reading operations. Once the read levels are calibrated through preliminary corrective reads, the system can perform standard reads with minimal energy consumption, as the costly corrective read operations are only needed periodically to maintain accuracy.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20250201316A1Conditional valley tracking during corrective reads
Publication Date: 2025.06.19 MICRON TECHNOLOGY INC
  • US20250201316A1 patent drawing
  • US20250201316A1 patent drawing
  • US20250201316A1 patent drawing

AI summary

An example memory device includes a memory array and processing logic, operatively coupled with the memory array. The processing logic is configured to perform operations, including: identifying a set of sample voltages associated with a chosen read level; obtaining, for each sample voltage of the set of sample voltages, a cell count corresponding to a number of target cells of the memory array that have a threshold voltage lower than the sample voltage; and determining, based on the cell count, a calibrated read level associated with a state information bin to which the target cells are assigned.