Configurable IC Trigger Circuits for Filtered Debug Event Counting
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Solution Overview
Problem
Traditional debug networks in integrated circuits (ICs) face challenges such as resource inefficiency, inability to provide meaningful data, and interference with primary circuit functionality, leading to the need for a configurable secondary network that offers custom debugging capabilities tailored to user needs.
Innovation Solution
A secondary circuit structure within the IC that is separate from the primary data routing fabric, allowing users to select resources for monitoring, define trigger events, and capture relevant data with filters, enabling efficient data storage and analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a fixed-function debug network is implemented, then debugging functionality is provided, but resources are wasted when debug functionality is not needed
Solution Approach 1:
The debug network transitions from a static fixed-function implementation to a dynamic reconfigurable implementation. The debug circuits can be configured at runtime to enable or disable specific monitoring and debugging functions based on actual user needs, allowing the system to adapt its resource consumption to match actual debugging requirements.
Solution Approach 2:
The debug network's functionality parameters are made changeable through reconfiguration. Instead of being fixed at design time, the debug circuits can be programmed to monitor different signals, apply different filtering criteria, and activate different trigger conditions, allowing optimal resource utilization for each specific debugging scenario.
2Productivity
If a configurable secondary network is implemented, then debugging efficiency is improved, but device complexity increases
Solution Approach 1:
The secondary debug network is designed with multi-functional circuits that can perform various debugging tasks through reconfiguration. The same physical circuits can monitor different signals, apply different filtering operations, and trigger different events based on configuration, reducing the need for separate dedicated circuits for each debugging function.
Solution Approach 2:
The patent uses configuration data and programming to create virtual instances of debugging functionality rather than physical hardware copies. The reconfigurable circuits are programmed to emulate different debug functions, reducing hardware complexity while maintaining functional versatility.
3Reliability
If extensive regression testing is performed, then reliability is improved, but time consumption increases
Solution Approach 1:
The debug network is configured in advance with specific monitoring criteria, trigger conditions, and filtering rules that are tailored to the user's debugging needs. This preliminary configuration allows the system to focus on specific potential issues rather than monitoring all possible signals, reducing the need for extensive post-deployment regression testing.
Solution Approach 2:
The patent replaces extensive manual regression testing with automated monitoring and trigger-based event capture. The reconfigurable debug circuits automatically detect and log specific events based on pre-configured criteria, substituting time-consuming manual testing and verification with automated event-driven monitoring.
Data Source
AI summary
Some embodiments provide an integrated circuit (“IC”). The IC includes multiple configurable circuits that configurably perform operations of a user design based on configuration data. The IC also includes a configurable trigger circuit that receives a set of configuration data that specifies an operational event. The configurable trigger circuit also determines whether the operational event has occurred during implementation of the user design of the IC. Additionally, the operational trigger event outputs a trigger signal upon determining that the operational trigger event has occurred.