Configurable Reference Resistor for Fuse Status Detection
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Solution Overview
Problem
The existing methods for determining the status of a fuse element in memory devices are inadequate due to process variants causing resistance issues, leading to incorrect identification and requiring costly and time-consuming modifications to the reference resistor.
Innovation Solution
A semiconductor circuit with a configurable reference resistor unit and a latch circuit that adjusts resistance to match the fuse element's resistance, allowing accurate status determination without the need for additional photomasks or restarting the manufacturing process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a fixed reference resistor is used in the test circuit, then the manufacturing process is simple, but the fuse status cannot be correctly identified when process variants cause resistance deviations
Solution Approach 1:
The reference resistor is transformed from a fixed value to a dynamically adjustable value. The test circuit includes a reference resistor with adjustable resistance that can be configured to different resistance values to match the actual fuse element resistance, enabling accurate status identification despite process variants.
Solution Approach 2:
The resistance parameter of the reference resistor is made changeable. By adjusting the reference resistor's resistance value to match the fuse element's resistance, the measurement accuracy is improved while accommodating process variations without requiring manufacturing process changes.
2Measurement precision
If the reference resistor is modified to address resistance mismatches, then the fuse status identification accuracy improves, but the manufacturing process must be restarted with additional photomasks, increasing time and cost
Solution Approach 1:
The adjustable reference resistor is built into the test circuit during normal manufacturing, preparing the system in advance to handle resistance mismatches. This eliminates the need for post-manufacturing modifications or process restarts, as the reference resistor can be adjusted to match the fuse element resistance without additional photomasks.
Solution Approach 2:
The adjustable reference resistor acts as an intermediary between the test circuit and the fuse element. It mediates the resistance mismatch issue by providing a configurable reference value that adapts to process variants, avoiding the need to modify the fuse element or restart manufacturing.
3Measurement precision
If the reference resistor is modified to address resistance mismatches, then the fuse status identification accuracy improves, but additional photomasks and manufacturing modifications are required, increasing cost
Solution Approach 1:
The reference resistor is designed with adjustable resistance capability built into the standard manufacturing process. This dynamic reference resistor can be configured to different resistance values without requiring additional photomasks or manufacturing modifications, maintaining ease of manufacture while improving measurement precision.
4Adaptability or versatility
If a fixed reference resistor is used, then the device structure is simple, but it cannot adapt to process variants causing resistance deviations
Solution Approach 1:
The reference resistor is transformed from a static fixed value to a dynamic adjustable value. The test circuit includes control mechanisms that allow the reference resistor resistance to be adjusted, enabling the system to adapt to process variants while adding only minimal complexity to the overall device structure.
Data Source
AI summary
A method for determining a status of a fuse element are provided. The method includes providing the memory device including a first terminal and a second terminal; applying a first power signal on the first terminal of the semiconductor device, wherein the memory device includes a configurable reference resistor unit electrically coupled to the fuse element; obtaining an evaluation signal, in response to the first power signal, at the second terminal of the memory device; and identifying the evaluation signal to determine whether the memory device is redundant.