Contoured Surface Illumination for Shallow Defect Inspection

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Solution Overview

Problem

Existing inspection and illumination systems for jet engine parts struggle to capture shallow geometric defects due to the orientation of the light source relative to the contoured surface, leading to inadequate image contrast and difficulty in identifying defects, particularly when using line scan cameras.

Innovation Solution

The system employs a surface profile compensator that adjusts the light distribution over the contoured surface by shaping the light source to match the 3D surface profile, altering illumination densities, and varying the illumination direction to enhance image contrast, using a combination of passive and active deformation of the support structure and light intensity control.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If the light source is positioned normal to the surface near the camera, then the inspection system is simple to operate, but shallow geometric defects cannot be captured due to inadequate image contrast

Engineering Contradiction:
Improveease of operationVSAvoidmeasurement precision
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The illumination system uses multiple light sources positioned at different angles relative to the camera axis, with each light source providing localized illumination from a specific direction. This allows different regions of the contoured surface to be illuminated optimally for detecting various types of defects, resolving the contradiction between operational simplicity and measurement precision.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent transitions from single-directional illumination (normal to surface) to multi-directional illumination by positioning light sources at different angular positions. This dimensional change in illumination approach enables the system to capture shallow geometric defects that would be invisible with normal illumination, improving measurement precision while maintaining ease of operation through automated multi-angle imaging.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Device complexity

If a bar-style light source is used, then the device complexity is reduced, but high divergent contrast is created due to distance variation from the light source to the 3D surface

Engineering Contradiction:
Improvedevice complexityVSAvoidreliability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The illumination system is segmented into multiple independent light sources rather than using a single bar-style source. Each light source can be independently positioned and controlled, allowing the system to maintain simple device architecture while eliminating the divergent contrast problem by providing more uniform illumination across the contoured surface through strategic positioning.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs asymmetric positioning of light sources relative to the camera and workpiece, with light sources placed at specific angular positions that are not symmetrically equivalent. This asymmetric arrangement optimizes illumination uniformity across the 3D surface, reducing distance variation effects and improving reliability without significantly increasing device complexity.

Inventive Principle:
Principle #4Asymmetry

3Ease of manufacture

If the light source orientation is normal to the surface, then the illumination system is simple to implement, but image contrast on geometric defects is insufficient for effective defect detection

Engineering Contradiction:
Improveease of manufactureVSAvoidloss of information
Core Design Contradiction:
Ease of manufactureVSLoss of information

Solution Approach 1:

The illumination system incorporates dynamic positioning of light sources at multiple angular positions, allowing the illumination direction to be varied to optimize contrast for different defect types and surface geometries. This dynamic approach maintains ease of manufacture through standardized components while preventing information loss about shallow geometric defects through multi-angle imaging.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent creates a universal illumination system that can detect multiple types of defects (shallow geometric defects, surface cracks, coating defects) using the same multi-angle light source configuration. This multi-functional approach ensures comprehensive defect detection without losing information about various defect types, while maintaining ease of manufacture through a standardized multi-source platform.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach improves image contrast on geometric defects, allowing for better defect detection on 3D contoured surfaces by ensuring uniform or targeted light distribution, thereby enhancing the inspection process.

Implementation Method 1

The support structure may be formed from a pliable material that conforms in part to a shape of the contoured surface when the support structure contacts the contoured surface

Methodology Applied
Scientific EffectPassive deformation: Deformation

Implementation Method 2

The inspection system may include one or more actuators that actively deform the support structure to complement the contours of the contoured surface

Methodology Applied
Scientific EffectActive deformation: Deformation

Implementation Method 3

The controller acts as the surface profile compensator by adjusting an intensity of the light source at different locations to distribute the light over the inspection area according to the target light distribution

Methodology Applied
Scientific EffectLight intensity control: Light

Data Source

PatentUS12549861B2Part surface inspection and illumination system
Publication Date: 2026.02.10 GENERAL ELECTRIC CO
  • US12549861B2 patent drawing
  • US12549861B2 patent drawing
  • US12549861B2 patent drawing

AI summary

An inspection system is provided. The inspection system includes a light source and a surface profile compensator. The light source illuminates a contoured surface of a part. The surface profile compensator causes light emitted from the light source to be distributed over an inspection area of the contoured surface according to a target light distribution.