Controller SPO Sensor Block Scan Exclusion
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Solution Overview
Problem
Existing semiconductor memory devices face challenges in maintaining data integrity during sudden power off (SPO) events, leading to potential data loss or incorrect determination of memory block deterioration, which can result in unnecessary scan operations and inefficiencies.
Innovation Solution
A controller with an SPO sensor, command generator, SPO information storage, and block scan controller is implemented to sense SPO events, register affected memory blocks, and exclude them from scan operations, ensuring accurate data handling and reducing unnecessary scans.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If scan operations are performed on all memory blocks after SPO events, then data integrity can be verified, but scan performance deteriorates due to unnecessary scans on already-affected blocks
Solution Approach 1:
The patent segments memory blocks into two categories: SPO-affected blocks (stored in SPO block table) and non-affected blocks. This segmentation allows the scan operation to selectively target only non-affected blocks, avoiding unnecessary scans on already-affected blocks while maintaining data integrity verification on relevant blocks.
Solution Approach 2:
The patent performs preliminary action by recording the target memory block information in the SPO block table immediately when an SPO event occurs. This preliminary recording enables the subsequent scan operation to efficiently identify and exclude affected blocks without performing redundant scans, thus improving scan performance while maintaining reliability.
2Productivity
If scan operations exclude SPO-affected blocks, then scan performance improves by reducing unnecessary scans, but data integrity may be compromised if affected blocks are not verified
Solution Approach 1:
The patent implements feedback by using the SPO block table to provide information about affected blocks to the scan controller. The scan controller receives this feedback and adjusts scan operations accordingly - excluding blocks from routine scans while maintaining the ability to verify integrity when needed, thus balancing performance and reliability.
3Productivity
If the controller stores SPO block information, then unnecessary scan operations are reduced, but device complexity increases due to additional storage and sensing components
Solution Approach 1:
The controller performs self-service by internally recording and managing SPO block information in its own SPO block table, eliminating the need for external tracking mechanisms. The SPO sensor and storage components are integrated within the controller, allowing it to autonomously manage scan operations without increasing overall system complexity.
Data Source
AI summary
A controller controls an operation of a semiconductor memory device including a plurality of memory blocks. The controller includes a command generator, a sudden power off (SPO) sensor, an SPO information storage, and a block scan controller. The command generator generates a command for controlling the semiconductor memory device. The SPO sensor generates an SPO sensing signal by sensing occurrence of SPO. The SPO information storage stores SPO block information indicating a memory block that is a target of a current operation (target memory block) in response to the SPO sensing signal. The block scan controller controls the command generator to perform a scan operation on the plurality of memory blocks, except for the target memory block, in response to the SPO block information.