Converter Self-Test Using Phase-Independent Bin Power Analysis
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Solution Overview
Problem
Testing mixed-signal intellectual property core systems using specialized external equipment is impractical and costly due to restricted access and high manufacturing costs, necessitating a cost-effective alternative for evaluating device performance.
Innovation Solution
A built-in self-test system utilizing an on-chip controller to determine a figure of merit, such as signal-to-noise ratio, by sending a stimulus signal and analyzing the response signal's frequency domain bin powers without requiring external test equipment, allowing for phase-independent testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If specialized external testing equipment is used to test mixed-signal IP core systems, then measurement precision is improved, but manufacturing cost increases and device complexity increases
Solution Approach 1:
The device under test performs self-testing through an on-chip controller that generates test signals and analyzes response signals internally. This eliminates the need for external specialized testing equipment, thereby reducing manufacturing costs while maintaining testing capability through built-in self-test (BIST) functionality
Solution Approach 2:
The testing functionality is merged with the device itself by integrating an on-chip controller that combines signal generation, signal processing, and measurement capabilities into a single integrated unit. This consolidation eliminates separate external testing equipment and reduces overall system complexity
2Measurement precision
If specialized external testing equipment is used to test mixed-signal IP core systems, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The testing functionality is merged with the device itself by integrating an on-chip controller that combines signal generation, signal processing, and measurement capabilities into a single integrated unit. This consolidation eliminates separate external testing equipment and reduces overall system complexity
3Measurement precision
If external access to internal cores is provided for testing, then measurement precision is improved, but ease of operation worsens due to restricted access
Solution Approach 1:
The device performs self-testing through an on-chip controller that generates test signals and analyzes response signals internally without requiring external access to internal cores. This maintains measurement precision while improving ease of operation by eliminating access restrictions
Data Source
AI summary
A method and apparatus for performing an on-system built-in self-test of a converter are provided. In the method, a controller generates a test signal and outputs the test signal to the converter. The controller receives a response signal from the converter and determines a plurality of bin powers of a plurality of bins, respectively, of a frequency domain signal representative of the response signal. The controller determines a figure of merit for the converter based on a first bin power of a first bin of the plurality of bin powers, where the first bin corresponds to a frequency of the test signal.