Correlated Electron Switch Storage Array for Scalable Non-Volatile Memory

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Solution Overview

Problem

Current non-volatile memory technologies, such as flash memory, face challenges in scaling below 40 nanometers and exhibit issues like temperature dependence, instability, and fatigue in resistance-based memories like ReRAM/CBRAM, necessitating an improved solution for reliable data storage.

Innovation Solution

The development of a storage array utilizing correlated electron switches (CES) with control circuitry, which transitions between conductive and insulative states through quantum mechanical phenomena, minimizing parasitic sneak paths and enabling reliable, scalable non-volatile memory operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If flash memory is used to achieve high bit density and fast access, then storage capacity and speed are improved, but scaling below 40 nanometers becomes difficult

Engineering Contradiction:
Improvestorage capacity and access speedVSAvoidfeature size scalability
Core Design Contradiction:
ProductivityVSLength of moving object

Solution Approach 1:

The patent changes the fundamental operating parameter from charge storage (flash memory) to resistance state storage (correlated electron switches). By utilizing electron correlation effects and Mott transitions, the system achieves memory functionality through resistance changes rather than charge accumulation, enabling continued scaling below 40nm while maintaining high density and speed.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces the mechanical/physical charge trapping mechanism of flash memory with a quantum mechanical electron correlation mechanism. The correlated electron switch uses electronic effects (Mott transition) rather than physical charge storage, allowing for smaller feature sizes while maintaining functionality.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Length of moving object

If resistance-based memory (ReRAM/CBRAM) is used to achieve scalability, then feature size reduction is enabled, but temperature dependence and instability occur

Engineering Contradiction:
Improvefeature sizeVSAvoidmemory stability and temperature independence
Core Design Contradiction:
Length of moving objectVSReliability

Solution Approach 1:

The patent utilizes the Mott transition, a quantum mechanical phase transition between insulating and conducting states driven by electron correlation effects. This transition is fundamentally different from thermal phase transitions and is controlled by electronic mechanisms rather than thermal ones, providing temperature-independent operation and improved stability while maintaining scalability.

Inventive Principle:
Principle #36Phase transitions

Solution Approach 2:

The patent replaces thermally-driven resistance switching mechanisms with quantum mechanically-driven electron correlation switching. By using Mott transitions controlled by voltage-induced electron accumulation rather than thermal effects, the system achieves temperature-independent operation and enhanced reliability.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Ease of operation

If resistance switching in ReRAM/CBRAM is implemented, then memory operation is achieved, but fatigue occurs over many memory cycles

Engineering Contradiction:
Improvememory write capabilityVSAvoidmemory cycle lifetime
Core Design Contradiction:
Ease of operationVSDuration of action of stationary object

Solution Approach 1:

The patent replaces filamentary or defect-based resistance switching (prone to fatigue) with a clean electron correlation mechanism. The Mott transition in correlated electron switches is a reversible electronic effect that does not involve physical degradation, migration, or defect formation, enabling millions of write cycles without fatigue.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the switching mechanism from physical/chemical resistance changes (prone to degradation) to electronic correlation changes (reversible and fatigue-free). By controlling electron accumulation and Mott transitions through voltage, the system achieves durable, fatigue-resistant memory operation.

Inventive Principle:
Principle #35Parameter changes

4Productivity

If cross-point array configuration is used to increase density, then bit density is improved, but parasitic sneak paths increase

Engineering Contradiction:
Improvebit densityVSAvoidparasitic sneak paths
Core Design Contradiction:
ProductivityVSObject-generated harmful factors

Solution Approach 1:

The patent applies local quality by making each correlated electron switch inherently selective through its non-linear current-voltage characteristics. The Mott transition provides a sharp threshold behavior that enables local addressability, allowing the system to maintain high density in cross-point configurations while suppressing parasitic paths through the selective switching behavior of individual elements.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The CES-based storage array provides a scalable and reliable non-volatile memory solution by controlling electron correlations to switch between states, reducing unintended rewrites and maintaining memory integrity across multiple cycles, thus overcoming the limitations of existing technologies.

Implementation Method 1

correlated electron switches (CES) with control circuitry, which transitions between conductive and insulative states through quantum mechanical phenomena

Methodology Applied
Scientific EffectElectron correlation:

Implementation Method 2

transitions between conductive and insulative states through quantum mechanical phenomena

Methodology Applied
Scientific EffectQuantum mechanical phenomenon:

Data Source

PatentUS10777273B2Cross-point storage array including correlated electron switches
Publication Date: 2020.09.15 ARM LTD
  • US10777273B2 patent drawing
  • US10777273B2 patent drawing
  • US10777273B2 patent drawing

AI summary

A device comprising a storage array, the storage array comprising a first signal line and a second signal line, at least one correlated electron switch in electrical communication with the first signal line and the second signal line, and control circuitry for driving the correlated electron switch with at least one programming signal.