Cross-Configured Conductive Probe Tip for Semiconductor Inspection
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Solution Overview
Problem
Existing conductive probes face challenges in achieving reliable electrical contact with semiconductor integrated circuits and electronic parts due to their fragile end portions and the need to consider complex electrode and wiring shapes, which can lead to abrasion and patterning failures during inspection.
Innovation Solution
A conductive probe design featuring a first end portion with four linear ridges and five vertexes arranged in a cross pattern, allowing for multiple contact points and improved durability, reducing the necessity for precise alignment and rotation considerations in the conductive probe unit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a conventional conductive probe with a simple tip structure is used, then the device complexity is low, but the reliability of electrical contact deteriorates due to fragile end portions and inability to contact various electrode shapes
Solution Approach 1:
The probe tip is segmented into multiple linear ridges (first to fourth linear ridges) and vertexes (first to fifth vertexes) instead of a single contact point. This segmentation allows different portions of the tip to contact different parts of the electrode or wiring, improving reliability while distributing mechanical stress across multiple segments rather than concentrating it at a single point
Solution Approach 2:
The probe tip employs an asymmetric configuration with linear ridges of varying lengths and positions, where the first to fourth linear ridges are spaced apart and arranged to form a cross pattern. This asymmetric design enables the probe to adapt to asymmetric electrode shapes and wiring configurations, improving contact reliability without requiring perfect alignment
2Duration of action of stationary object
If the conductive probe uses a single contact point, then the structure is simple, but the durability deteriorates due to concentrated stress and abrasion at the contact point
Solution Approach 1:
The tip is divided into multiple linear ridges and vertexes that distribute contact stress across multiple locations. This segmentation prevents concentrated stress at a single point, reducing abrasion and extending the probe's service life while maintaining structural integrity during repeated contact operations
Solution Approach 2:
The multiple linear ridges and vertexes act as preliminary cushioning elements that distribute and absorb mechanical stress before it can concentrate at any single point. This prior cushioning effect prevents excessive stress concentration that would otherwise lead to tip deformation or breakage, thereby improving durability
3Ease of operation
If the conductive probe requires precise alignment with electrodes and wiring, then contact precision is high, but the ease of operation deteriorates due to rotation considerations and complex positioning requirements
Solution Approach 1:
The probe tip is designed with multiple linear ridges and vertexes that can contact various electrode shapes and wiring configurations (horizontal, bent, spherical solder balls). This multi-functional design allows the same probe structure to effectively contact different geometries without requiring precise alignment adjustments, simplifying operation while maintaining adequate contact precision
Solution Approach 2:
The asymmetric arrangement of linear ridges creates a configuration that is insensitive to rotation and misalignment. The cross-pattern spacing of the ridges ensures that at least one ridge or vertex will make contact regardless of the probe's rotational orientation, eliminating the need for precise angular alignment and simplifying positioning operations
Data Source
AI summary
Provided is a conductive probe having a first end portion and a second end portion opposing the first end portion. The first end portion includes first to fourth linear ridges and first to fifth vertexes, and the first to fourth linear ridges are spaced from one another and arranged to form a cross. The first to fourth vertexes are located on an outer circumference of the first end portion and further arranged between the first linear ridge and the second linear ridge, between the second linear ridge and the third linear ridge, between the third linear ridge and the fourth linear ridge, and between the fourth linear ridge and the first linear ridge, respectively.