Cross Matrix Switching for Automated Short Circuit Test Platforms
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Solution Overview
Problem
Automated test equipment systems face challenges in efficiently providing and managing multiple test signals to numerous test points within devices under test, often requiring a large number of voltage sources and complex switching systems to ensure accurate testing and device swapping.
Innovation Solution
An automated test platform with N voltage sources and a cross matrix switching system that provides N different voltages to M discrete test points, coupled with an N voltage measuring system using analog-to-digital converters, allows for selective voltage application and measurement across multiple test points, and includes an automated DUT swap system for sequential testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a high quantity of voltage sources is used to provide test signals to numerous test points, then the testing capability and coverage are improved, but the device complexity and cost increase significantly
Solution Approach 1:
The patent implements a crossbar switching matrix that allows N voltage sources to serve M test points where M > N. Each voltage source can be dynamically connected to any test point through the switching matrix, enabling one voltage source to perform multiple testing functions across different test points at different time intervals, thereby reducing the total number of voltage sources needed while maintaining comprehensive testing capability
Solution Approach 2:
The system employs dynamic switching control where the crossbar matrix continuously reconfigures connections between voltage sources and test points based on the current testing requirements. This dynamic allocation allows the same N voltage sources to sequentially serve different test points, transforming a static one-to-one mapping into a dynamic many-to-many relationship that reduces system complexity
2Device complexity
If a cross matrix switching system is used to reduce the number of voltage sources, then the device complexity is reduced, but the switching speed and test accuracy may be compromised
Solution Approach 1:
The system pre-configures switching sequences and connection patterns before actual testing begins. The crossbar matrix is programmed with optimal switching paths and timing, allowing rapid transitions between test points without real-time calculation delays. This preliminary preparation ensures that when testing commences, all switching operations can execute at maximum speed without compromising test accuracy
3Device complexity
If multiple voltage sources are reduced to N sources with crossbar switching, then the cost and complexity are reduced, but the measurement precision and voltage stability may deteriorate
Solution Approach 1:
The patent introduces dedicated voltage sensing circuits and measurement systems that act as intermediaries between the crossbar switching matrix and the test points. These intermediary measurement systems continuously monitor voltage levels at each test point, providing real-time feedback to ensure voltage stability and accuracy is maintained even though fewer voltage sources are being used with dynamic switching
4Productivity
If automated switching sequences are implemented to manage voltage application, then the productivity and testing efficiency are improved, but the system complexity and control difficulty increase
Solution Approach 1:
The system incorporates self-testing and self-calibration capabilities where the automated test equipment can autonomously verify its own switching sequences, voltage levels, and measurement accuracy without external intervention. This self-service functionality reduces the need for complex external control systems and manual calibration procedures, thereby improving productivity while keeping control complexity manageable
Data Source
AI summary
An automated test platform for testing a first device under test includes N voltage sources for providing N different voltages. A cross matrix switching system is coupled to the N voltage sources, the cross matrix switch being configured to provide the N different voltages to M discrete test points within the first device under test, wherein M is larger than N. An N voltage measuring system is coupled to the first device under test, the N voltage measuring system being configured to measure the voltage potential present on the M discrete test points.