Cross-Point Memory Cell Voltage Control for Heat Interference

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Solution Overview

Problem

Cross-point type storage devices face challenges in accurately writing data onto target memory cells due to heat-generated interference from selected cells, leading to erroneous selection of unselected memory cells.

Innovation Solution

A specific voltage application method is employed where voltages applied to memory cells satisfy certain relationships (e.g., Va>Vd>Vb and Va>Vd>Vc) to prevent erroneous selection, ensuring accurate control of memory cells by maintaining lower voltages for unselected cells adjacent to the selected cell, and using a two-terminal switch element with chalcogen elements for selection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a voltage greater than threshold voltage is applied to select a memory cell, then the selected memory cell can be accurately controlled, but heat-generated interference causes unselected memory cells to be erroneously selected

Engineering Contradiction:
Improvememory cell selection accuracyVSAvoidheat-induced interference
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent applies different voltage levels (Va, Vb, Vc, Vd) to different groups of memory cells based on their selection status and position relative to the selected cell. By changing the voltage parameters according to the selection state, the patent achieves precise control of the target memory cell while suppressing heat-induced interference in unselected cells, thereby resolving the contradiction between selection accuracy and heat interference.

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If higher voltage is applied to the selected memory cell to ensure accurate control, then selection precision is improved, but heat interference increases causing erroneous selection of adjacent cells

Engineering Contradiction:
Improvedata writing precisionVSAvoidheat interference from selected cell
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The patent applies different voltage levels to different spatial locations of memory cells. The selected memory cell receives voltage Va for accurate control, while adjacent unselected cells receive lower voltages (Vb or Vc) to prevent heat-induced erroneous selection. This spatial differentiation of voltage quality allows high precision data writing without generating excessive heat interference in surrounding areas.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent preemptively applies lower voltages (Vb, Vc) to unselected memory cells that are adjacent to the selected cell before the heat interference can cause erroneous selection. This preliminary protective action prevents the harmful effect of heat from the selected cell from affecting unselected cells, thereby maintaining data writing precision without excessive heat generation.

Inventive Principle:
Principle #9Preliminary anti-action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method effectively prevents unselected memory cells from being erroneously selected, achieving accurate control and reducing heat-induced interference, thereby enhancing data writing precision in cross-point type storage devices.

Implementation Method 1

each memory cell including a variable resistance element having a first state and a second state where a resistance thereof is higher than that in the first state

Methodology Applied
Scientific EffectVariable resistance: Electrical Resistance

Implementation Method 2

a selection element that is electrically connected to the variable resistance element in series and becomes conductive when a voltage greater than a threshold voltage is applied across the memory cell

Methodology Applied
Scientific EffectThreshold voltage effect: Diode

Implementation Method 3

heat-generated interference from selected cells, leading to erroneous selection of unselected memory cells

Methodology Applied
Scientific EffectJoule heating: Joule Heating

Data Source

PatentUS10847223B2Storage device
Publication Date: 2020.11.24 KIOXIA CORP
  • US10847223B2 patent drawing
  • US10847223B2 patent drawing
  • US10847223B2 patent drawing

AI summary

A storage device includes a first group of wirings extending in a first direction, a second group of wirings extending in a second direction, and memory cells between the first and second groups, each including a variable resistance element and a selection element becoming conductive when a voltage greater than a threshold is applied. Va applied across a first cell to be selected satisfies Va>Vd>Vb and Va>Vd>Vc. A first wiring of the first group and a second wiring of the second group are connected to the first cell. A third wiring of the first group and a fourth wiring of the second group are adjacent to the first wiring and the second wiring. Vb, Vc, and Vd are applied across a second cell between the first and fourth wirings, a third cell between the second and third wirings, and a fourth cell between the third and fourth wirings.