Cryptographic Chip Fault Injection Using Pulse Rise and Peak Timing
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Solution Overview
Problem
Existing electromagnetic fault injection methods for cryptographic chips lack temporal accuracy, leading to inefficiencies in differential fault analysis and reduced success rates of effective injections.
Innovation Solution
A high-temporal-accuracy electromagnetic fault injection method and apparatus that adjusts fault injection time based on both peak and rise times of electromagnetic pulse signals, using an XYZ-direction three-axis displacement platform, electromagnetic pulse generator, and electromagnetic probe to precisely control fault injection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a transient electromagnetic pulse is used for fault injection, then the spatial positioning accuracy is improved, but the temporal accuracy of fault injection deteriorates
Solution Approach 1:
The patent performs preliminary actions by pre-calibrating the relationship between probe position and fault injection time, and pre-determining the optimal injection timing based on signal rise time characteristics. This allows the system to compensate for temporal inaccuracies through pre-computed correction factors and timing offsets established before the actual attack
Solution Approach 2:
The patent changes parameters by adjusting the electromagnetic pulse waveform characteristics (rise time, amplitude, duration) based on the target chip's response characteristics. By optimizing these parameters, the system achieves better temporal precision in fault injection while maintaining spatial positioning accuracy
2Device complexity
If only pulse peak moment is considered for fault injection timing, then the injection process is simplified, but the fault injection accuracy deteriorates
Solution Approach 1:
The patent performs preliminary characterization of the electromagnetic pulse signal by measuring its rise time and peak time relationships in advance. This preliminary analysis enables the system to determine the optimal injection moment more accurately without significantly increasing the complexity of the injection process itself
Solution Approach 2:
The patent employs feedback mechanisms by monitoring the actual fault injection results and adjusting the timing parameters accordingly. Through iterative optimization, the system refines its understanding of the relationship between pulse characteristics and fault injection effectiveness, thereby improving accuracy while maintaining process simplicity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances the accuracy of fault injection, improves the efficiency and effectiveness of differential fault analysis, and increases the success rate of effective fault injections by accurately controlling the injection time.
Implementation Method 1
The fault injection mode based on the transient electromagnetic pulse is to generate a transient electromagnetic field by applying transient voltage pulse signals to two ends of a coil, so that transient induced voltage and current are introduced in a target chip
Data Source
AI summary
Disclosed in the present application are a high-temporal-accuracy electromagnetic fault injection method and apparatus for a cryptographic chip. The method includes: adjusting fault injection time jointly according to peak time and rise time of an electromagnetic pulse signal, thereby enhancing the accuracy of controlling injection time, improving the analysis efficiency and effect of differential fault analysis, and increasing the success rate of the effective fault injection.