Crystalline Phase Identification Using Normalized Vectors
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Solution Overview
Problem
Current methods for identifying crystalline phases in samples, such as those in metallic workpieces, are inefficient due to the need for correlating entire data sets in energy-dispersive X-ray spectroscopy and electron backscatter diffraction, which slows down the identification process, especially in polycrystalline samples.
Innovation Solution
The method involves determining normalized vectors for chemical composition and diffraction bands, comparing them with expected crystal structures, and calculating evaluation factors to quickly identify the most similar crystal structure at each measurement point, utilizing energy-dispersive X-ray spectroscopy and electron diffraction images, and using pre-stored structural information from databases like CIF format.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If entire data sets are correlated in energy-dispersive X-ray spectroscopy and electron backscatter diffraction, then identification accuracy is maintained, but analysis speed decreases
Solution Approach 1:
The patent segments the correlation process by separating the search space into discrete crystal structure candidates from databases. Instead of correlating entire continuous data sets, the method divides the problem into comparing measured diffraction patterns against pre-defined structural models, significantly reducing computational complexity while maintaining identification accuracy.
Solution Approach 2:
The patent applies preliminary action by pre-compiling crystal structure data in databases with predicted diffraction patterns for various orientations. This pre-processing allows the actual measurement to be quickly matched against pre-calculated references, eliminating the need for real-time complex correlations and dramatically speeding up phase identification.
2Reliability
If repeated data correlation is performed for each measurement point, then comprehensive phase identification is achieved, but measurement time increases
Solution Approach 1:
The patent uses copying by storing reference diffraction patterns and crystal structure data in databases. Instead of performing repeated full correlations, the system copies pre-computed structural information and compares it with measured data, maintaining comprehensive identification capability while reducing measurement time through efficient pattern matching.
Solution Approach 2:
The patent changes parameters by transforming the correlation problem into a pattern matching problem with predefined structural parameters. By using crystallographic parameters (lattice constants, atomic positions) as the basis for comparison rather than full data set correlation, the method achieves comprehensive phase identification with significantly reduced computational time.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly speeds up the identification of unknown crystalline phases by using normalized vectors, allowing for faster analysis and reducing the need for repeated data correlation, thus enhancing the efficiency of routine measurements.
Implementation Method 1
An electron beam with uniform energy is directed to the relevant measurement point of the sample and the resulting X-ray emission is detected. The detected characteristic X-ray radiation reveals the elementary composition of the sample.
Implementation Method 2
Electron Backscatter Diffraction (EBSD) is a method of structural analysis which serves to identify crystals in a sample. In this method, the diffraction of electrons on the crystal lattice (the so-called diffraction image) is evaluated for the purposes of phase analysis or crystal structure analysis.
Data Source
AI summary
Methods and arrangements identify crystalline phases in a polycrystalline sample by determining a normalized vector p(i) for the chemical composition of the expected crystal structure, at each measurement point of the sample, recording a spectrum by means of energy-dispersive X-ray spectroscopy and determining the chemical composition, and recording an electron diffraction image and determining of the diffraction bands. The methods and arrangements also determine a normalized vector v for the chemical composition, compare the normalized vector v with each of the normalized vectors p(i) of the expected crystal structures and outputting an evaluation factor s(i) for the similarity of the vectors in each case, compare the diffraction bands with those of the expected crystal structures and outputting an evaluation factor n(i), and determining an overall quality from the two evaluation factors and identifying the crystal structure with the highest overall quality as belonging to the measurement point.