Material Analysis By Measuring Secondary Emission TRIZ Cases
- X-Ray Fluorescence Peak Identification With Multi-Line Verification
Candidate element lists and linked line-type displays simplify X-ray fluorescence peak verification and improve identification accuracy for non-experts.
- Particle Beam Illumination for Extended-Range High-Resolution Imaging
A scanned particle beam with charge control overcomes optical wavelength and reflectance limits for high-resolution imaging beyond 10 meters.