X-ray Analysis Target Assembly for Throughput Optimization
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Solution Overview
Problem
X-ray analysis systems face reduced throughput due to the need for alternating movements between monitoring X-ray beam properties and performing analysis, which interrupts the analysis process and reduces efficiency.
Innovation Solution
A system with a target assembly that includes measurement targets, controlled by a processor, allowing for simultaneous monitoring of X-ray beam properties and performing analysis without moving the stage, by positioning the targets in and out of the optical path to alternate between monitoring and analysis phases.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the system alternates between monitoring X-ray beam properties and performing analysis, then measurement precision is improved, but productivity deteriorates due to reduced throughput
Solution Approach 1:
The system divides the measurement function into two independent parts: a dedicated monitoring target for beam property measurement and the sample for analysis. This segmentation allows simultaneous operation of both functions without interference, resolving the contradiction between monitoring precision and analysis throughput
Solution Approach 2:
The patent introduces a temporal dimension by alternating between monitoring and analysis modes in time-separated cycles. The processor controls the target assembly to switch between positions, enabling the system to achieve both precise monitoring and high throughput by operating in different time slots rather than spatial competition
2Reliability
If the system performs continuous monitoring of X-ray beam properties, then reliability is improved, but loss of time increases due to interrupted analysis
Solution Approach 1:
The system implements periodic monitoring cycles where the target assembly alternates between monitoring positions and analysis positions in regular time intervals. This periodic action ensures reliable beam property control while minimizing analysis interruption time through optimized cycle timing
Solution Approach 2:
The system performs preliminary monitoring assessments to determine when full monitoring cycles are necessary. By using preliminary checks, the system can reduce the frequency of complete monitoring sequences, thereby maintaining reliability while minimizing time loss for analysis interruptions
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach maintains high throughput by enabling continuous X-ray analysis while monitoring beam properties, improving stability and reducing the time required for monitoring, thus enhancing the overall efficiency of the system.
Implementation Method 1
Fluorescence radiation that is excited from one or more of the measurement targets, or from the sample, in response to the impinged X-ray beam, is received
Implementation Method 2
receive fluorescence radiation excited from the sample in response to the impinged X-ray beam
Data Source
AI summary
A system for X-ray analysis, includes: (a) an X-ray analysis assembly configured to (i) direct an X-ray beam to impinge on a surface of a sample, and (ii) receive fluorescence radiation excited from the sample in response to the impinged X-ray beam, (b) a target assembly including measurement targets: placed in an optical path between the X-ray analysis assembly and the sample, and configured to move between (i) one or more first positions in which one or more of the measurement targets are positioned in the X-ray beam, and (ii) one or more second positions in which the optical path is unobstructed by the target assembly, and (c) a processor, configured to control movement of the target assembly between the first and second positions, for alternately, (i) monitoring properties of the X-ray beam using the measurement targets, and (ii) performing the X-ray analysis at a measurement site of the sample.