X-ray Analysis Device Valence Calculation Calibration

Solution Overview

Problem

Existing X-ray analysis devices inaccurately calculate the mean valence of metals in samples containing both metal simple substances and compounds due to deviations in peak energy measurements, particularly when a metal simple substance with valence 0 is present.

Innovation Solution

An X-ray analysis device with a spectrometer and signal processing unit that uses a calibration curve based on peak energies of Kα1 and Kα2 X-rays from metal simple substances and compounds to accurately calculate the mean valence by applying the peak energies to a linear calibration curve generated using the parameter (Kα1−n·Kα2), where n is a coefficient.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If a calibration curve based on Kβ X-ray peak energy is used to detect mean valence, then the detection method is simple, but the accuracy deteriorates when metal simple substances (valence 0) are present in the sample

Engineering Contradiction:

Improvedetection method simplicityVSAvoidmean valence calculation accuracy

Core Design Contradiction:

Ease of operationVSMeasurement precision

Solution Approach 1:

The invention changes the calibration parameter from Kβ peak energy alone to a combination of Kα1 and Kα2 peak energies. By using the parameter (Kα1−n·Kα2) where n is a coefficient, the calibration curve accurately reflects the relationship between peak energy and valence across all compounds including metal simple substances, thereby improving measurement precision without complicating the detection method

Inventive Principle:

Principle #35Parameter changes

Solution Approach 2:

The invention creates a corrected calibration curve that accurately represents the true relationship between peak energy and valence. This corrected calibration model (copying the true physical relationship) replaces the inaccurate original calibration, enabling accurate mean valence calculation even when metal simple substances are present in the sample

Inventive Principle:

Principle #26Copying

2Ease of manufacture

If a calibration curve is generated using only Kβ X-ray peak energy, then the calibration process is straightforward, but the calculation accuracy deteriorates due to deviations in peak energy measurements

Engineering Contradiction:

Improvecalibration process simplicityVSAvoidpeak energy measurement accuracy

Core Design Contradiction:

Ease of manufactureVSMeasurement precision

Solution Approach 1:

The invention changes the calibration parameter from Kβ peak energy alone to a combination of Kα1 and Kα2 peak energies. By using the parameter (Kα1−n·Kα2) where n is a coefficient, the calibration curve accurately reflects the relationship between peak energy and valence across all compounds including metal simple substances, thereby improving measurement precision without complicating the detection method

Inventive Principle:

Principle #35Parameter changes

Solution Approach 2:

The invention creates a corrected calibration curve that accurately represents the true relationship between peak energy and valence. This corrected calibration model (copying the true physical relationship) replaces the inaccurate original calibration, enabling accurate mean valence calculation even when metal simple substances are present in the sample

Inventive Principle:

Principle #26Copying

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach improves the accuracy of mean valence calculation in samples containing metal simple substances and compounds, even when the simple substance has a valence of 0, by using a linear calibration curve that simplifies the calculation process and reduces errors.

Implementation Method 1

a spectrometer configured to detect intensity of characteristic X-rays for each wavelength by dispersing the characteristic X-rays

Methodology Applied

Scientific EffectX-ray dispersion: Diffraction

Implementation Method 2

Characteristic X-rays emitted by the sample irradiated with the excitation ray have a wavelength determined by the atomic contained in the sample

Methodology Applied

Scientific EffectX-ray excitation: Photoelectric Effect

Implementation Method 3

The characteristic X-rays generated by the transition of electrons from the L-shell to the K-shell is called Kα X-ray, and the characteristic X-rays generated by the transition of electrons from the M-shell to the K-shell is called Kβ X-ray

Methodology Applied

Scientific EffectElectron transition radiation: X-Ray

Data Source

PatentUS11740190B2X-ray analysis device including a spectrometer to detect characteristic X-rays and related X-ray analysis method

Publication Date: 2023.08.29 SHIMADZU CORP

AI summary

Provided is an X-ray analysis device and an X-ray analysis method capable of easily analyzing a valence of a target element in a sample. A controller 22 of a signal processing device of the X-ray analysis device is provided with: a storage unit 360 for storing a calibration curve generated based on a peak energy of Kα1 X-ray and a peak energy of Kα2 X-ray emitted from a metal simple substance, a peak energy of Kα1 X-ray and a peak energy of Kα2 X-ray emitted from each of two or more types of compounds each containing the metal simple substance, and a valence of the metal in each of the two or more types of compounds; a processing unit 302 configured to acquire a peak energy of Kα1 X-ray and a peak energy of Kα2 X-ray of the metal emitted from the metal contained in an unknown sample; and a calculation unit 308 configured to calculate a mean valence of the metal contained in the unknown sample by applying the obtained peak energy of Kα1 X-ray and peak energy of Kα2 X-ray to the calibration curve.