Dangling Metal Route Detection in Semiconductor Chip Design

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Solution Overview

Problem

The semiconductor industry faces challenges in efficiently identifying design faults in semiconductor chip designs due to bad design practices, which can lead to silicon failures and increased fabrication costs, particularly in complex designs with millions of transistors where manual review is time-consuming and prone to errors.

Innovation Solution

A system comprising a partition component and an analysis component that scans metal layers to detect long dangling metal routes exceeding a predefined threshold, with a learning component to refine exceptions based on feedback, facilitating efficient detection and correction of design errors before fabrication.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If manual review of semiconductor chip design is performed, then design errors can be identified, but the process is time-consuming and prone to human error

Engineering Contradiction:
Improveerror detection accuracyVSAvoidreview time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent replaces the manual mechanical review process with an automated computer-based system that uses algorithms to detect dangling metal routes. The system automatically scans layout data, identifies potential errors, and generates reports without human intervention, thereby eliminating time consumption and human error while maintaining high detection accuracy.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system enables self-service error detection by automatically analyzing the chip design layout data without requiring manual inspection. The automated detection algorithm independently identifies dangling metal routes exceeding threshold lengths, allowing the design process to proceed without time-consuming manual review while maintaining reliable error detection.

Inventive Principle:
Principle #25Self-service

2Reliability

If the threshold for dangling metal route length is set low, then more potential errors are detected, but false positives increase requiring additional verification

Engineering Contradiction:
Improveerror detection coverageVSAvoidverification complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The system dynamically adjusts the threshold parameter for dangling metal route length based on design specifications and empirical data. By optimizing this parameter, the system achieves an ideal balance between detecting all potential errors and minimizing false positives, reducing verification complexity while maintaining comprehensive error detection coverage.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The system incorporates feedback mechanisms where detection results and false positive rates are analyzed to refine the threshold setting. This iterative optimization process allows the system to adjust the threshold to achieve the best balance between error detection coverage and false positive reduction, simplifying the overall verification process.

Inventive Principle:
Principle #23Feedback

3Productivity

If automated detection system is implemented, then review time is reduced, but system complexity increases

Engineering Contradiction:
Improvedetection speedVSAvoidsystem complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The automated detection system is segmented into distinct functional modules: data input module, detection algorithm module, threshold comparison module, and report generation module. This segmentation allows each component to perform a specific function efficiently, reducing overall system complexity while maintaining high detection speed and productivity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The detection system is designed as a universal platform that can analyze different chip design layouts and metal routing configurations using the same core algorithms. This multi-functionality reduces system complexity by avoiding the need for separate specialized tools for different design types, while maintaining high productivity across various semiconductor design scenarios.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS7915907B2Faulty dangling metal route detection
Publication Date: 2011.03.29 CYPRESS SEMICONDUCTOR CORP
  • US7915907B2 patent drawing
  • US7915907B2 patent drawing
  • US7915907B2 patent drawing

AI summary

A system is provided that facilitates locating long dangling metal routes in a semiconductor chip design. The system includes mechanisms for partitioning metal features of the chip design to discover dangling metal routes that could be potential violations. The system further comprises mechanisms for determining if the dangling metal routes of the chip design exceed a length limit that could result antenna violations, undesired noise in the circuit, circuitry breakdown or the like. The system enables excessively long dangling metal routes to be allowed as exceptional cases. Machine learning is provided to receive feedback to refine the exceptional cases and enable more efficient fault detection.