Dark-Field Microscopy Angle Control to Prevent Secondary Reflections
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Solution Overview
Problem
Current automation cell mass production devices struggle to achieve a balance between automation convenience and image monitoring quality, particularly in dark-field image capturing, due to interference from secondary illumination caused by improper dark-field illumination design.
Innovation Solution
A microscopic observation method and device that adjusts the incident angle of a light beam from a dark-field illumination based on calculations of the specimen carrier's length, thickness, and relative distance to the microscope objective, using a controller to optimize image capture without interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If dark-field illumination is used for cell nucleus contour observation, then image monitoring quality is improved, but secondary illumination interference occurs due to improper design
Solution Approach 1:
The patent adjusts the incident angle of the light beam as a key parameter to eliminate secondary illumination interference. By calculating and setting the optimal incident angle based on the specimen carrier's dimensions and position, the system achieves clear dark-field imaging without harmful secondary reflections.
Solution Approach 2:
The patent replaces manual adjustment of illumination angles with an automated calculation and adjustment system. The controller computes the optimal incident angle based on measured parameters (length, thickness, relative distance) and automatically adjusts the dark-field illumination, substituting mechanical manual operation with automated control.
2Productivity
If automation equipment is integrated for cell mass production, then productivity is improved, but integration with commercial microscope systems becomes difficult due to space and control requirements
Solution Approach 1:
The patent divides the illumination adjustment into independent measurable parameters (length, thickness, relative distance) that can be independently detected and calculated. This segmentation allows the complex integration problem to be broken down into manageable measurement and calculation steps, facilitating integration with automation equipment.
Solution Approach 2:
The system performs self-adjustment by automatically measuring its own geometric parameters (length, thickness, relative distance) and calculating the optimal incident angle without external intervention. This self-service capability reduces control complexity and facilitates integration with automated production systems.
3Measurement precision
If the incident angle of dark-field illumination is adjusted, then secondary reflections are prevented and image quality is improved, but additional measurement and calculation steps are required
Solution Approach 1:
The patent performs preliminary measurement of the specimen carrier's length, thickness, and relative distance before image capture. By obtaining these parameters in advance and calculating the optimal incident angle beforehand, the system prepares the illumination settings proactively, avoiding complex real-time adjustments during imaging.
Solution Approach 2:
The system uses feedback from measured parameters (length, thickness, relative distance) to automatically determine the optimal incident angle. The controller receives measurement data, calculates the appropriate angle, and adjusts the illumination accordingly, creating a closed-loop system that simplifies the overall process despite multiple measurement steps.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The method and device enable clear observation of cell nuclei without staining, enhancing image quality and automation efficiency by preventing secondary reflections, thus improving the accuracy and speed of image analysis.
Implementation Method 1
adjusting an incident angle of a light beam emitted from a dark-field illumination towards the specimen carrier... preventing secondary reflections
Data Source
AI summary
A microscopic observation method configured to observe a specimen in a specimen carrier that includes the following steps: placing the specimen carrier at an observation point; obtaining a length of the specimen carrier along a movement direction, a thickness of the specimen carrier along an observation direction of a microscope objective, an observation angle of the microscope objective, and a relative distance between a lateral surface of the specimen carrier and the microscope objective along the movement direction; and adjusting an incident angle of a light beam emitted from a dark-field illumination towards the specimen carrier according to a calculation result of the length, the thickness, the observation angle, and the relative distance.