Data Driving Circuit for Pixel Degradation Detection
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Solution Overview
Problem
Existing display devices struggle to accurately detect the degree of pixel degradation, which can affect image quality and device performance over time.
Innovation Solution
A data driving circuit is designed to output a test data voltage to dummy pixels, allowing for the detection of pixel degradation by comparing the sensing signals from these dummy pixels with those from active pixels.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a data driving circuit outputs only normal data signals to pixels, then the pixel circuit operates normally for display, but the degree of pixel degradation cannot be detected
Solution Approach 1:
The patent applies preliminary action by introducing dummy pixels that are pre-configured with test circuitry before normal operation. These dummy pixels receive test data voltages during non-display periods (horizontal blanking period) to proactively detect degradation before it affects actual display quality. The degradation detection circuit continuously monitors dummy pixel responses to predict future pixel performance.
Solution Approach 2:
The patent segments the display panel into functional pixels for normal display and dummy pixels for degradation testing. This segmentation allows the test circuitry to be spatially separated from the main display area, enabling degradation detection without interfering with normal image output. The dummy pixels are positioned in non-display regions while sharing the same data line infrastructure.
2Reliability
If dummy pixels are added to the display panel for degradation testing, then pixel degradation can be detected, but the display panel area and manufacturing complexity increase
Solution Approach 1:
The patent utilizes the vertical dimension (non-display area adjacent to data driver) to position dummy pixels, rather than consuming horizontal display area. Dummy pixels are arranged in rows or columns within the peripheral region, leveraging unused spatial dimensions to accommodate test structures without reducing active display real estate.
Solution Approach 2:
The dummy pixels share common infrastructure with functional pixels, including data lines, scan lines, and the pixel circuit architecture. This multi-functionality allows the same circuit design to serve both display and testing purposes, reducing the need for entirely separate test structures and minimizing area overhead.
3Measurement precision
If test data voltages are output during the horizontal blanking period, then pixel degradation detection is enabled, but the data driver circuit complexity increases
Solution Approach 1:
The patent implements periodic action by outputting test data voltages during the horizontal blanking period, which occurs regularly between display frames. This periodic testing rhythm allows the data driver to alternate between normal data output and test signal output without requiring continuous test operation, simplifying the control logic while maintaining detection capability.
Solution Approach 2:
The data driver circuit serves itself by using its existing output capabilities to generate both normal data signals and test data voltages through the same data lines. The circuit leverages its own infrastructure for self-diagnosis, eliminating the need for separate dedicated test signal generation hardware and reducing overall system complexity.
Data Source
AI summary
A data driving circuit includes: a reference voltage generator that receives a data control signal and generates a gamma reference voltage and a test reference voltage, a data driving unit that outputs a data signal for a pixel based on the gamma reference voltage, and an output circuit that outputs a test data voltage for a dummy pixel based on the test reference voltage.