Direct Bonded Copper Ceramic Substrate Passivation

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Solution Overview

Problem

The existing direct bonded copper ceramic substrates used in high-power IGBT modules face issues with bonding strength, thermal conductivity, and reliability due to reactions between copper oxide and aluminum nitride surfaces, leading to the formation of bubbles that degrade performance.

Innovation Solution

A direct bonded copper ceramic substrate is developed with a nitride ceramic substrate coated with a passivation layer of aluminum or silicon oxide doped with metals like titanium, vanadium, chromium, manganese, iron, cobalt, nickel, or copper, which is applied between the ceramic substrate and copper layers to enhance bonding and reduce bubble formation, thereby improving peel strength and thermal conductivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Strength

If copper oxide is used to bond to aluminum nitride ceramic substrate, then bonding is achieved, but bubbles form at the interface reducing bonding strength and thermal conductivity

Engineering Contradiction:
Improvebonding strengthVSAvoidinterface reliability
Core Design Contradiction:
StrengthVSReliability

Solution Approach 1:

A magnesium oxide layer is introduced as an intermediary between the copper oxide and aluminum nitride ceramic substrate. This intermediate layer prevents direct harmful reactions between copper oxide and aluminum nitride, eliminating bubble formation at the interface while maintaining effective thermal and mechanical coupling. The magnesium oxide acts as a protective mediator that resolves the contradiction between achieving bonding and preventing interface defects.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The potential harmful reaction between copper oxide and aluminum nitride is converted into a beneficial process by controlling the oxidation sequence. Copper is first oxidized to copper oxide, which would normally be harmful, but then magnesium is oxidized to form magnesium oxide that protects the aluminum nitride from direct contact with copper oxide. The harmful copper oxide reaction is thus transformed into a useful protective mechanism.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Loss of energy

If aluminum nitride ceramic substrate is used for high thermal conductivity, then thermal performance is improved, but surface treatment is required to prevent bubble formation

Engineering Contradiction:
Improvethermal conductivityVSAvoidsurface treatment process
Core Design Contradiction:
Loss of energyVSDevice complexity

Solution Approach 1:

Magnesium oxide layer is formed on the aluminum nitride substrate surface before the copper bonding process. This preliminary action of creating the protective magnesium oxide barrier prevents the need for complex surface treatments later, as it inherently protects the aluminum nitride from harmful reactions with copper oxide while maintaining thermal conductivity.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The substrate structure is transformed into a composite system with multiple layers: aluminum nitride ceramic substrate, magnesium oxide protective layer, and copper bonding layer. This composite structure combines the high thermal conductivity of aluminum nitride with the protective properties of magnesium oxide, eliminating the need for complex surface treatments while maintaining energy efficiency.

Inventive Principle:
Principle #40Composite materials

3Strength

If direct bonding of copper to ceramic is performed at high temperature, then bonding strength is achieved, but thermal cycle reliability decreases due to bubble formation

Engineering Contradiction:
Improvebonding strengthVSAvoidthermal cycle reliability
Core Design Contradiction:
StrengthVSDuration of action of stationary object

Solution Approach 1:

The magnesium oxide layer serves as a stable intermediary that remains intact during high-temperature bonding and subsequent thermal cycling. It prevents direct contact between copper oxide and aluminum nitride, eliminating bubble formation that would compromise long-term reliability. This mediator enables strong bonding while ensuring durability through thermal cycles.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The magnesium oxide layer is formed beforehand to cushion and protect the aluminum nitride substrate from harmful reactions during the bonding process and subsequent thermal cycling. This prior protective measure prevents bubble formation that would otherwise develop during thermal expansion and contraction, ensuring long-term reliability.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution significantly enhances the peel strength and thermal conductivity of the copper foil to the ceramic substrate, reducing bubble formation and improving the reliability of the substrate for high-power applications.

Implementation Method 1

the surfaces of the aluminum nitride ceramic substrate need an additional treatment (e.g. oxidation) to form stable inert passivation layers

Methodology Applied
Scientific EffectOxidation: Oxidation

Implementation Method 2

the copper oxide of the copper foil surface bonds to the ceramic substrate

Methodology Applied
Scientific EffectChemical Bonding: Chemical Bonding

Implementation Method 3

heated under an inert atmosphere to 1050° C. to 1080° C., so that the copper oxide of the copper foil surface bonds to the ceramic substrate

Methodology Applied
Scientific EffectThermal Energy: Heating

Data Source

PatentUS11076483B2Direct bonded copper ceramic substrate
Publication Date: 2021.07.27 IND TECH RES INST
  • US11076483B2 patent drawing
  • US11076483B2 patent drawing

AI summary

A direct bonded copper ceramic substrate is provided, which includes a nitride ceramic substrate, a first passivation layer, and a first copper layer. The first passivation layer includes aluminum oxide or silicon oxide doped with another metal. The other metal is titanium, vanadium, chromium, manganese, iron, cobalt, nickel, copper, or a combination thereof. The aluminum or silicon and the other metal have a weight ratio of 60:40 to 99.5:0.5. The first passivation layer is disposed between the top surface of the nitride ceramic substrate and the first copper layer.